Internal Test Validation Mechanism for Semiconductor Self-Test

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Solution Overview

Problem

Conventional semiconductor devices face challenges in reducing test time and overhead due to the need for extensive data communication and comparison during self-testing, which limits their minimum test-time capabilities and increases operational latency.

Innovation Solution

Incorporating an internal test validation mechanism within the semiconductor device that analyzes test results and provides a higher-level summary to external testers, using registers and comparison circuitry like XOR gates to reduce data exchange and improve communication efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional self-test methods are used with extensive data communication and comparison, then test coverage and reliability are improved, but test time and operational latency increase

Engineering Contradiction:

Improvefailure detectabilityVSAvoidtest time

Core Design Contradiction:

ReliabilityVSLoss of time

Solution Approach 1:

The patent extracts the test result analysis function from the external tester and places it inside the semiconductor device through an internal test validation mechanism. This internal mechanism validates test patterns and compares test results internally, eliminating the need for extensive data communication with external testers and significantly reducing test time while maintaining test coverage.

Inventive Principle:

Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces an internal test validation mechanism as an intermediary between the test pattern generator and the external tester. This intermediary validates test patterns before they are applied and compares test results internally, reducing the amount of data that needs to be communicated externally and thereby reducing test time while maintaining reliability.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Area of stationary object

If device footprint is reduced to meet market demands, then device size and manufacturing costs are improved, but circuit robustness and failure detectability deteriorate

Engineering Contradiction:

Improvedevice footprintVSAvoidcircuit robustness

Core Design Contradiction:

Area of stationary objectVSReliability

Solution Approach 1:

The patent merges the test validation functionality with the existing semiconductor device structure by integrating an internal test validation mechanism that uses available internal resources such as registers and comparison circuitry. This approach adds minimal overhead to the device footprint while significantly improving failure detectability through internal validation and comparison operations.

Inventive Principle:

Principle #5Merging (Combining)

Data Source

PatentUS11848067B2Apparatus including internal test mechanism and associated methods

Publication Date: 2023.12.19 MICRON TECHNOLOGY INC

AI summary

An apparatus including a test validation circuit and associated systems and methods are disclosed herein. The apparatus may include a self-test circuit configured to implement at least a portion of a self-test process that determines operating conditions of the apparatus. The test validation circuit may be configured to generate a flag based on comparing (1) an input stream or a portion thereof associated with the self-test to (2) test data associated with the self-test. The flag may represent a validity associated with the implementation of the self-test process or the portion thereof.