Interposer Global ESD Bus for Cross-Chip Protection

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Solution Overview

Problem

Current ESD protection schemes for 2.5D/3D integrated circuit structures are limited to intra-chip protection and lack a robust cross-chip ESD discharge path, increasing the risk of ESD failure at chip-to-chip interfaces.

Innovation Solution

A global ESD bus is integrated into the interposer, connected to each chip's ESD bus, providing a continuous ESD protection network across the entire I/O domain for robust cross-chip ESD protection, utilizing a conductive mesh or ring layout within the interposer to facilitate efficient ESD current discharge.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a global ESD bus is integrated into the interposer, then cross-chip ESD protection is improved, but interposer complexity increases

Engineering Contradiction:
Improvecross-chip ESD protectionVSAvoidinterposer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The ESD bus in the interposer is designed to serve multiple functions: it provides ESD discharge paths for multiple chips simultaneously, acts as a ground reference plane, and maintains signal integrity for I/O connections. This multi-functionality reduces the need for separate dedicated ESD structures, thereby limiting the increase in complexity while achieving comprehensive cross-chip protection.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The ESD bus is integrated using the same conductive materials and fabrication processes as the existing interposer interconnect structure. By making the ESD bus homogeneous with the interposer's existing conductive layers, the patent avoids introducing fundamentally new structures or materials, thereby minimizing the increase in manufacturing complexity while providing robust cross-chip ESD protection.

Inventive Principle:
Principle #33Homogeneity

2Reliability

If ESD discharge paths are minimized, then ESD protection performance is improved, but design flexibility deteriorates

Engineering Contradiction:
ImproveESD protection performanceVSAvoidinterconnect design flexibility
Core Design Contradiction:
ReliabilityVSAdaptability or versatility

Solution Approach 1:

The patent resolves the conflict between minimized discharge paths and design flexibility by transitioning from two-dimensional planar ESD paths to three-dimensional vertical paths through the interposer. The ESD bus extends vertically through multiple conductive layers of the interposer, providing short discharge paths in the vertical dimension while maintaining horizontal design flexibility for I/O routing and chip placement.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The implementation of a global ESD bus in the interposer enhances ESD protection by providing a comprehensive cross-chip discharge path, reducing the risk of ESD failure and improving ESD performance by minimizing discharge paths and maintaining flexibility in interconnect designs.

Implementation Method 1

A global ESD bus is integrated into the interposer, connected to each chip's ESD bus, providing a continuous ESD protection network across the entire I/O domain for robust cross-chip ESD protection, utilizing a conductive mesh or ring layout within the interposer to facilitate efficient ESD current discharge

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS10262989B2ESD protection for 2.5D/3D integrated circuit systems
Publication Date: 2019.04.16 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US10262989B2 patent drawing
  • US10262989B2 patent drawing
  • US10262989B2 patent drawing

AI summary

An integrated circuit structure includes first and second integrated circuit devices disposed on a interposer. Each integrated circuit device has electrostatic discharge (ESD) protection circuitry therein connected to an internal ESD bus. The first and second integrated circuit devices communicate with one another through the interposer. The interposer includes an ESD bus electrically connected to the ESD busses of the first and second integrated circuit devices for providing cross-device ESD protection for the integrated circuit devices.