Thermally Conductive Interposer for IC Hotspot Cooling

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Solution Overview

Problem

Existing IC packaging technologies are inadequate in selectively cooling hotspots on semiconductor dice, leading to inefficient temperature management and increased power dissipation, which limits chip performance and reliability, especially as transistor density and frequency increase.

Innovation Solution

The implementation of a thermally conductive interposer coupled to the IC die at hotspot contact pads, with thermal and electrical conductivity, using thermal interconnects like nodules to direct heat away from hotspots, and optionally coupled to a heat spreader or heat slug for enhanced cooling.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If transistor density and operating frequency are increased to improve performance, then processing power increases, but power dissipation and heat generation increase

Engineering Contradiction:
Improveprocessing powerVSAvoidpower dissipation
Core Design Contradiction:
ProductivityVSLoss of energy

Solution Approach 1:

The patent extracts heat from specific high power density regions by introducing thermally conductive nodules at hotspot contact pads. These nodules act as localized heat extraction points that pull thermal energy away from hotspots before it can spread to surrounding areas, enabling the system to sustain higher power densities in critical regions without compromising overall thermal management

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The thermally conductive nodules serve as intermediary elements between the die hotspots and the external thermal management system. These nodules mediate heat transfer by providing high thermal conductivity pathways at specific contact pad locations, efficiently conducting heat away from hotspot regions while maintaining electrical isolation where needed

Inventive Principle:
Principle #24Intermediary (Mediator)

2Temperature

If thermally conductive nodules are placed at hotspot contact pads, then hotspot cooling is improved, but device complexity increases

Engineering Contradiction:
Improvehotspot temperatureVSAvoidpackage structure
Core Design Contradiction:
TemperatureVSDevice complexity

Solution Approach 1:

The patent achieves multi-functionality by designing nodules that can serve both thermal and electrical functions depending on their material composition and placement. The same nodule structure can provide thermal conduction for cooling while simultaneously serving as an electrical interconnect, or can be configured to provide thermal management with electrical isolation, thereby reducing the need for separate dedicated thermal and electrical components

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution effectively reduces the overall temperature of the IC die and minimizes temperature differences across the chip, improving performance and reliability by targeted heat removal from hotspots, while being cost-effective and reliable for various IC package designs.

Implementation Method 1

a thermally conductive interposer coupled to the IC die at hotspot contact pads

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Data Source

PatentEP1858076B1Method and apparatus for cooling semiconductor device hot blocks and large scale integrated circuit (ic) using integrated interposer for ic packages
Publication Date: 2019.10.30 AVAGO TECHNOLOGIES INTERNATIONAL SALES PTE LTD
  • EP1858076B1 patent drawingFigure 1
  • EP1858076B1 patent drawingFigure 2A~2B
  • EP1858076B1 patent drawingFigure 3A

AI summary

A method, system, and apparatus for improved IC device packaging is described. In an aspect, an (IC) device package includes an IC die having at one or more contact pads, each contact pad located at a corresponding hotspot on a surface of the IC die. The package also includes a thermally conductive interposer which is thermally coupled to the IC die at the contact pads. In another aspect, an underfill material fills a space between the IC die and the interposer. The interposer may also be electrically coupled to the IC die. In an aspect, the interposer and the IC die are coupled through thermal interconnects or "nodules."