Interposer-Based Automated Spike Testing for Integrated Circuits
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Solution Overview
Problem
Current post-silicon integrated circuit (IC) spike testing is laborious, time-consuming, and prone to human error due to the need for manual handling of probes and oscilloscope observation, often resulting in incomplete testing and potential damage to ICs and tester resources from undetected voltage spikes.
Innovation Solution
An apparatus with an interposer that automates signal selection and analysis between the tester and the IC, using a signal processing apparatus to evaluate parameters and reduce manual intervention, allowing for automated spike testing without the need for continuous human observation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If manual probe handling and oscilloscope observation are used for spike testing, then testing can be performed with simple equipment, but testing time increases significantly and human error occurs
Solution Approach 1:
The patent introduces an interposer as an intermediary device between the tester and the IC. The interposer includes a multiplexer that automatically selects and routes signals from multiple IC pins to a minimal set of oscilloscope channels, eliminating the need for manual probe handling and significantly reducing testing time while maintaining spike detection capability
Solution Approach 2:
The patent creates a simplified copy of the IC pinout through the interposer's multiplexer matrix, where only essential pins are routed to the oscilloscope. This copying approach allows automated signal selection and reduces the complexity of manual probing while preserving the ability to detect voltage spikes
2Reliability
If manual probe positioning is used for each test point, then equipment complexity remains low, but testing completeness decreases and errors increase
Solution Approach 1:
The interposer serves as a mediator that provides automated signal routing between the IC and the oscilloscope. It includes a multiplexer controlled by a computer to automatically select and route signals from multiple IC pins, ensuring comprehensive testing without manual intervention and eliminating human error while maintaining manageable system complexity
Solution Approach 2:
The patent replaces the manual mechanical probing system with an automated electronic switching system. The multiplexer electronically routes signals based on computer control, substituting manual probe positioning and observation with automated signal selection and analysis, thereby improving reliability without excessive complexity
3Measurement precision
If continuous human observation of oscilloscope is required, then spike detection can be performed, but testing time extends to days and labor intensity increases
Solution Approach 1:
The patent implements automated feedback control where the computer monitors the oscilloscope channels continuously, automatically selects which pins to monitor through the multiplexer, and identifies voltage spikes without human intervention. The system provides real-time feedback on signal levels and automatically logs spike events, maintaining detection precision while dramatically improving productivity
Solution Approach 2:
The testing system performs self-service through automated signal selection and analysis. The computer-controlled multiplexer automatically routes signals from IC pins to the oscilloscope based on the test program, and the system autonomously monitors for voltage spikes and records results, eliminating the need for continuous human observation and enabling high-throughput testing
4Reliability
If all IC pins are tested through complete ATE program, then comprehensive testing is achieved, but testing duration extends to days for high pin count devices
Solution Approach 1:
The patent extracts only the essential pins that need to be monitored for voltage spikes during ATE testing. The interposer's multiplexer selectively routes signals from a subset of IC pins to the oscilloscope based on the specific test program being executed, eliminating the need to manually probe all pins while maintaining comprehensive spike detection for relevant signals
Solution Approach 2:
The interposer provides a universal solution that can adapt to different IC pinouts and test programs. The multiplexer matrix can be reconfigured through software to route signals from any combination of IC pins to the limited oscilloscope channels, enabling comprehensive testing of different pin configurations without requiring physical reconfiguration or increasing testing time
Data Source
AI summary
Apparatus for testing an integrated circuit is described, including a set of signal conductors for communicating signals to respective external conductors of the integrated circuit. The apparatus also includes a tester comprising circuitry for outputting a signal. An interposer is electrically coupled between the set of signal conductors and the tester. The interposer comprises circuitry for selecting a set of signals between the set of signal conductors and the tester and outputting the set of signals. A signal processing apparatus is coupled to receive the set of signals, and the signal processing apparatus is operable to evaluate a parameter associated with each signal in the set of signals.