Inter-reflection Detection Using Multi-frequency Phase Analysis
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Solution Overview
Problem
Existing three-dimensional measurement techniques, such as active stereo measurement, face accuracy issues due to detection failures in regions with inter-reflection, where lights from multiple light sources are received by a pixel, leading to decreased measurement accuracy.
Innovation Solution
An inter-reflection detection apparatus that uses a combination of low-frequency and high-frequency sinusoidal patterns to determine phase differences, with phase connection processing to accurately detect inter-reflection regions by comparing phase differences across multiple combinations of patterns, ensuring accurate detection without failure.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single frequency sinusoidal pattern is used for phase measurement, then the measurement process is simple, but inter-reflection detection accuracy deteriorates due to detection failures in certain regions
Solution Approach 1:
The patent divides the measurement into multiple segments by using multiple frequency sinusoidal patterns (low-frequency and high-frequency) separately. Each frequency pattern provides phase information for specific regions, and by segmenting the measurement process, the system can detect inter-reflection more accurately without overwhelming complexity in a single measurement process.
Solution Approach 2:
The patent introduces a new dimension of analysis by comparing phase differences across multiple frequency patterns. Instead of relying on a single frequency measurement, the system adds the frequency dimension to the phase measurement, creating a multi-dimensional approach that improves inter-reflection detection accuracy while maintaining measurement simplicity.
2Reliability
If phase difference is determined using only low-frequency and high-frequency combinations, then detection coverage is limited, but computational complexity increases when evaluating all combinations
Solution Approach 1:
The patent applies partial action by evaluating only the necessary frequency combinations (low-frequency and high-frequency) rather than all possible combinations. This selective approach provides sufficient detection coverage for inter-reflection detection while avoiding the excessive computational complexity that would result from evaluating every possible frequency combination.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus effectively detects inter-reflection regions with high accuracy, expanding the range of reliable detection and preventing detection failures, thereby improving the overall measurement precision in three-dimensional position determination.
Implementation Method 1
an irradiation unit configured to emit light having variable-frequency (cycle) sinusoidal patterns
Implementation Method 2
the light projected to the measurement object reflects a plurality of times on the surface. This phenomena is called inter-reflection or multiple reflection
Implementation Method 3
an image acquisition unit configured to acquire an image of an object irradiated with the light from the irradiation unit
Data Source
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AI summary
Provided is an inter-reflection detection apparatus including: an irradiation unit configured to emit light having variable-frequency sinusoidal patterns; an image acquisition unit configured to acquire an image of an object irradiated with the light from the irradiation unit; a phase determination unit configured to determine a phase at each position in the image; and a detection unit configured to detect a region in which inter-reflection occurs. The detection unit is configured to determine a phase difference between a phase acquired from an image generated by irradiation of a low-frequency sinusoidal pattern and a phase acquired from an image generated by irradiation of a high-frequency sinusoidal pattern for a plurality of combinations of low-frequency waves and high-frequency waves, and determine that inter-reflection occurs in a region in which the phase difference for any one of the plurality of combinations is equal or more than a threshold.