Electronic Interrupter Aging Assessment via Current-Dependent Wear Tracking
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Solution Overview
Problem
Existing methods for determining the aging of electronic interruption elements, such as load switches and relays, fail to accurately account for the increased loading on contacts when currents flow during opening and closing operations, leading to premature failure and safety issues.
Innovation Solution
A method that initializes an aging counter and determines current-dependent and voltage-dependent aging values by simulating switch-on processes, incorporating time components and manufacturer-provided reference values to accurately assess the wear on electronic interruption elements, ensuring reliable operation by considering the actual loading during both opening and closing operations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If simple switching cycle counting is used to track aging, then the monitoring method is simple, but it cannot accurately map the actual aging of the electronic interruption element
Solution Approach 1:
The patent transforms the aging assessment from simple cycle counting to a multi-parameter evaluation system that incorporates current magnitude, voltage, temperature, and time-dependent factors. The aging value is calculated as a function of these varying parameters rather than uniform increments, enabling accurate reflection of actual wear conditions while maintaining computational feasibility through standardized algorithms.
2Device complexity
If current flow during opening is not considered, then the monitoring is simpler, but greater loading on contacts is missed leading to premature failure
Solution Approach 1:
The system performs preliminary assessment of current flow conditions during opening operations before they cause damage. By continuously monitoring current magnitude and duration during switching events, the system accumulates aging values that predict impending failure, allowing preventive maintenance or replacement before actual contact degradation occurs.
3Device complexity
If only mechanical loading is considered, then the assessment is simpler, but current-induced loading that causes premature failure is ignored
Solution Approach 1:
The patent segments the total loading assessment into distinct components: mechanical loading from contact movement, electrical loading from current flow during switching, thermal loading from resistive heating, and time-dependent degradation. Each component is calculated separately using appropriate sensors and algorithms, then combined to produce a comprehensive aging value that accurately reflects all stressors on the electronic interruption element.
Data Source
AI summary
The disclosure relates to a method for determining the aging of an electronic interrupter element which is configured to open and close a power circuit. The method according to the disclosure comprises the following steps: a) initializing an aging counter NWear, b) determining the amount I of a current which flows through the electronic interrupter element upon opening the power circuit, c) determining a current-dependent aging value Nwear (I) from the amount I of the current, d) refreshing the aging counter NWear using the current-dependent aging value Nwear (I). The disclosure further relates to a computer program and to an apparatus for determining the aging of an electronic interrupter element and to a battery management system which are in particular configured to carry out the method.