Intra-Cycle Timing Calibration for Integrated Circuit Devices
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Solution Overview
Problem
Designing and fabricating high-performance memory integrated circuit devices, such as DDR memory modules, is challenging due to stringent timing specifications and variability in manufacturing, leading to reliability and performance issues.
Innovation Solution
A method and system for automatically calibrating intra-cycle timing relationships between command, data, and sampling signals in integrated circuit devices, using a delay calibrator to adjust phase relationships and ensure optimal operation, even in the presence of manufacturing variations.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If manufacturing precision is increased to meet exacting timing specifications, then reliability improves, but manufacturing complexity and cost increase
Solution Approach 1:
The patent applies preliminary action by performing automatic calibration of timing parameters before the integrated circuit device is deployed. The system pre-determines optimal timing values for command, data, and sampling signals through automated measurement and adjustment, ensuring timing specifications are met without requiring extreme manufacturing precision. This preliminary calibration establishes a known stable condition that compensates for manufacturing variations.
Solution Approach 2:
The patent utilizes parameter changes by automatically adjusting timing parameters (such as phase relationships and delays) based on measured performance. The system varies timing parameters within acceptable ranges to find optimal values that satisfy timing specifications, allowing the device to adapt to manufacturing variations through parameter optimization rather than requiring fixed high-precision manufacturing.
2Productivity
If timing specifications are made more exacting to improve performance, then system performance improves, but design and fabrication difficulty increases
Solution Approach 1:
The patent applies self-service by implementing an automatic calibration system that performs timing measurements and adjustments without requiring external intervention or complex manual tuning. The integrated circuit device itself participates in the calibration process by providing test responses that enable the system to automatically determine optimal timing parameters, reducing design and fabrication complexity while maintaining high performance.
Solution Approach 2:
The patent utilizes feedback by measuring the actual timing relationships between signals and using this information to adjust timing parameters. The system continuously monitors timing performance and makes automated adjustments based on measured deviations, enabling the system to maintain exacting timing specifications without increasing overall design complexity through intelligent feedback control.
3Measurement precision
If manual calibration methods are used to adjust timing parameters, then measurement precision can be maintained, but time consumption and labor requirements increase
Solution Approach 1:
The patent applies mechanics substitution by replacing manual calibration operations with an automated electronic measurement and adjustment system. The system uses electronic signal generation, measurement, and control to automatically determine and adjust timing parameters, eliminating the need for manual intervention while maintaining or improving measurement precision. This substitution dramatically reduces calibration time and labor requirements.
Solution Approach 2:
The patent applies preliminary action by performing comprehensive timing measurements and adjustments automatically during the calibration phase before deployment. The system pre-determines all necessary timing parameters through automated processes, eliminating the need for time-consuming manual adjustments later. This preliminary automated calibration maintains measurement precision while significantly reducing overall time consumption.
Data Source
AI summary
A method for automatically calibrating intra-cycle timing relationships between command signals, data signals, and sampling signals for an integrated circuit device. The method includes generating command signals for accessing an integrated circuit component, accessing data signals for conveying data for the integrated circuit component, and accessing sampling signals for controlling the sampling of the data signals. A phase relationship between the command signals, the data signals, and the sampling signals is automatically adjusted to calibrate operation of the integrated circuit device.