Inverse Linescan Edge Detection for Unbiased Roughness Measurement
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Solution Overview
Problem
Existing methods for measuring roughness of pattern structures in noisy images, such as those from scanning electron microscopes, face challenges in differentiating noise from actual roughness, leading to biased measurements that are sensitive to metrology tool settings and prone to errors due to stochastic variations at the molecular scale.
Innovation Solution
A system and method that use an inverse linescan model to detect edges in pattern structures without filtering, generating a biased power spectral density dataset, evaluating noise models, and subtracting noise to obtain unbiased roughness measures, while filtering out artifacts to reveal true PSD behavior.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If noise filtering is applied to images before roughness measurement, then measurement reliability is improved, but measurement precision deteriorates due to loss of high-frequency roughness information
Solution Approach 1:
The PSD dataset is segmented into multiple frequency portions (low-frequency, mid-frequency, high-frequency ranges). This segmentation allows selective processing where noise is removed from certain frequency ranges while preserving roughness information in others, resolving the contradiction between noise removal and roughness preservation
Solution Approach 2:
Different processing approaches are applied to different frequency portions of the PSD dataset. The noise model is evaluated and applied selectively to specific frequency ranges where noise dominates, while preserving the high-frequency portions that contain actual roughness information, thus maintaining both reliability and precision
2Ease of operation
If conventional roughness measurement methods are used on noisy images, then ease of operation is maintained, but measurement precision deteriorates due to noise contamination
Solution Approach 1:
A noise model is evaluated from the PSD dataset before final roughness measurement. This preliminary noise characterization allows the noise to be subtracted or corrected in subsequent processing steps, improving measurement precision while maintaining ease of operation through automated model-based correction
Solution Approach 2:
The PSD dataset serves as an intermediary representation between the raw noisy image and the final roughness measurement. By transforming the problem into the frequency domain through PSD analysis, noise can be selectively removed while preserving roughness characteristics, then transforming back to obtain accurate roughness measurements
3Reliability
If metrology tool settings are adjusted to reduce noise, then measurement reliability is improved, but device complexity increases due to sensitivity to multiple settings
Solution Approach 1:
The approach transforms the measurement parameters from spatial domain image properties to frequency domain PSD characteristics. By evaluating the PSD dataset and identifying noise characteristics in the frequency domain, the method reduces sensitivity to metrology tool settings while maintaining reliability through parameter-based noise correction
4Measurement precision
If images are processed without filtering to preserve roughness information, then measurement precision is improved, but reliability deteriorates due to noise contamination
Solution Approach 1:
The noise present in the unfiltered images is converted into useful information through PSD analysis. By evaluating the high-frequency portion of the PSD dataset, the noise characteristics are identified and quantified, then this noise model is used to correct the roughness measurements, transforming the harmful noise into a beneficial correction mechanism
Data Source
AI summary
In one embodiment, a method for detecting edge positions in a pattern structure is disclosed. The method includes detecting the edge positions of features within the pattern structure of an image without filtering the image, wherein the detecting is performed by: applying a model to a single linescan, adjusting, based on the single linescan, one or more parameters of the model, obtaining, using the one or more adjusted parameters, a best fit of the model to the single linescan.


