I/O Pad Configuration Circuit for Single-Channel IC Testing

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Solution Overview

Problem

The limited number of tester channels for integrated circuits makes it difficult to test multiple input/output (I/O) resources effectively, especially as I/O resources evolve with added functionality, requiring reconfiguration of test circuitry for different communication protocols.

Innovation Solution

The integration of configuration circuitry in I/O circuits that can switch between modes using a control select signal, allowing multiple I/O pads to be coupled to a single tester channel without reconfiguring the integrated circuit, enabling simultaneous testing of various functions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple I/O pads are tested using multiple tester channels, then testing coverage is improved, but tester channel requirements increase

Engineering Contradiction:

Improvetesting coverageVSAvoidtester channel requirements

Core Design Contradiction:

ReliabilityVSQuantity of substance

Solution Approach 1:

Multiple I/O pads are electrically connected together to share a single tester channel. The configuration circuitry enables different I/O pads to be selectively connected to the same tester channel through switching mechanisms, allowing multiple pads to be tested sequentially using one channel instead of requiring separate channels for each pad.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The configuration circuitry provides multi-functionality by enabling a single tester channel to test multiple different I/O pads and functions. The circuitry can be reconfigured through multiplexing to accommodate different communication protocols and I/O functions, making the testing system universal rather than dedicated to specific pads or protocols.

Inventive Principle:

Principle #6Universality (Multi-functionality)

2Adaptability or versatility

If test circuitry is reconfigured for different communication protocols, then adaptability is improved, but reconfiguration time increases

Engineering Contradiction:

Improveprotocol compatibilityVSAvoidreconfiguration time

Core Design Contradiction:

Adaptability or versatilityVSLoss of time

Solution Approach 1:

The configuration circuitry is pre-designed with built-in multiplexing capabilities and switching mechanisms that allow rapid reconfiguration between different communication protocols. The circuitry is prepared in advance to support multiple protocols, enabling quick switching without extensive reconfiguration when testing different I/O functions or protocols.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The test circuitry incorporates dynamic switching elements that can rapidly change configuration states. The configuration circuitry uses controllable switches and multiplexers that can be reconfigured in real-time during testing, allowing the system to adapt between different communication protocols without static reconfiguration requirements.

Inventive Principle:

Principle #15Dynamics

Data Source

PatentUS7583102B1Testing of input/output devices of an integrated circuit

Publication Date: 2009.09.01 XILINX INC

AI summary

Method and apparatus for testing input/output circuits of an integrated circuit are described. An integrated circuit includes input/output circuits having input/output pads. The input/output pads are capable of being coupled together to a tester channel. The input/output circuits each are configurable via configuration circuitry to be in either a first mode or a second mode responsive to a select circuit of the configuration circuitry coupled to receive a first input for the first mode and a second input for the second mode. The select circuit is controlled responsive to a control select signal common to all or a portion of the select circuits of each of the input/output circuits.