Ion Beam Lithography for Ultra-Fine PCB Circuits

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Solution Overview

Problem

Existing etching methods struggle to achieve line widths and spacings of 20 μm or less in electronic circuits, resulting in low yield and high production costs, and are environmentally polluting due to the use of etching liquids.

Innovation Solution

An ion beam lithography method using a roll-roll printer with medium-high-energy, medium-low-energy, and low-energy ion sources to deposit wide-energy-range metal ions on a polyimide substrate, forming a metal film substrate with line widths and spacings less than 3 μm, eliminating the need for etching liquids and achieving high yield and low production costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If conventional etching methods are used, then the process is simple and cost-effective, but the line width and spacing cannot be reduced to 20 μm or less

Engineering Contradiction:
Improveline width and spacingVSAvoidetching system complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The invention changes the energy parameter of the ion beam from conventional single-energy to wide-energy-range (1 keV to 200 keV), enabling precise control of metal ion deposition at different depths and achieving ultra-fine line widths and spacings below 20 μm that cannot be obtained by conventional etching methods

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention replaces the chemical etching process with a physical ion beam deposition process. Instead of using chemical reagents to remove material, the invention uses ion beam to deposit metal ions precisely where needed, achieving finer dimensional control without the limitations of chemical etching

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Productivity

If conventional etching methods are used, then the process is straightforward, but the production yield is low and preparation cost is high

Engineering Contradiction:
Improveproduction yieldVSAvoidmanufacturing process simplicity
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

The invention performs preliminary surface treatment by implanting high-energy metal ions before the main deposition process. This preliminary action modifies the substrate surface properties, enhancing adhesion and enabling more efficient subsequent metal layer formation, which improves overall production yield

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The invention uses a continuous ion beam deposition process that can operate without interruption, maintaining steady-state deposition conditions. This continuous action ensures consistent film quality and reduces waste from rework, thereby improving production yield and reducing costs

Inventive Principle:
Principle #20Continuity of useful action

3Object-affected harmful factors

If conventional etching liquids are used, then the etching process can be performed, but environmental pollution occurs

Engineering Contradiction:
Improveenvironmental pollutionVSAvoidetching precision
Core Design Contradiction:
Object-affected harmful factorsVSManufacturing precision

Solution Approach 1:

The invention completely replaces chemical etching liquids with a physical ion beam deposition method. Metal ions are deposited directly onto the substrate through ion beam bombardment, eliminating the need for any chemical etching liquids and thus completely avoiding environmental pollution associated with chemical waste disposal

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The ion beam deposition process operates in a vacuum environment, creating an inert atmosphere that prevents unwanted chemical reactions. This clean environment ensures precise metal layer formation without contamination from chemical reagents, achieving both environmental friendliness and high manufacturing precision

Inventive Principle:
Principle #39Inert atmosphere (Inert environment)

4Stability of the object's composition

If single-energy ion beam is used, then the deposition process is simple, but the metal film density and smoothness are insufficient

Engineering Contradiction:
Improvemetal film density and smoothnessVSAvoidion source energy range
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The invention introduces a wide energy range (1 keV to 200 keV) for the ion beam, allowing metal ions to penetrate at different depths and energies. This parameter variation enables better control of film density and smoothness by depositing ions with different penetration capabilities, creating a more stable and uniform metal film structure

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The invention uses a dynamic ion beam energy distribution rather than a fixed single energy. The wide-energy-range ion beam provides a spectrum of energies that dynamically interact with the substrate, allowing ions to reach optimal positions and achieve dense, smooth film structure that cannot be obtained with static single-energy beams

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The method produces ultra-fine circuits with dense and smooth metal films, suitable for high-frequency and high-speed applications, while being environmentally friendly and cost-effective, overcoming the limitations of conventional etching techniques.

Implementation Method 1

using the ion beam lithography system to deposit a wide-energy-range metal ion on the preset circuit pattern of the etched substrate to form a metal film substrate

Methodology Applied
Scientific EffectIon beam deposition: Ion Beam

Implementation Method 2

using a medium-low-energy wide-range ion beam generated by the medium-low-energy wide-range ion source to deposit an ultra-thin metal layer

Methodology Applied
Scientific EffectPhysical vapor deposition: Physical Vapour Deposition

Implementation Method 3

using the medium-high-energy wide-range ion source to implant a medium-high-energy wide-range ion beam at the position of the preset circuit pattern on the surface of the etched substrate

Methodology Applied
Scientific EffectIon implantation: Ion Implantation

Implementation Method 4

a roll-roll printer placed in a vacuum

Methodology Applied
Scientific EffectVacuum: Vacuum

Data Source

PatentUS11538653B2Ion beam lithography method based on ion beam lithography system
Publication Date: 2022.12.27 BEIJING NORMAL UNIVERSITY
  • US11538653B2 patent drawing
  • US11538653B2 patent drawing
  • US11538653B2 patent drawing

AI summary

The present invention discloses an ion beam lithography method based on an ion beam lithography system. The ion beam lithography system includes a roll-roll printer placed in a vacuum, and a medium-high-energy wide-range ion source, a medium-low-energy wide-range ion source and a low-energy ion source installed on the roll-roll printer. The ion beam lithography method includes: first coating a polyimide (PI) substrate with a dry film, etching the dry film according to a preset circuit pattern, then using the ion beam lithography system to deposit a wide-energy-range metal ion on the circuit pattern to form a film substrate, and finally stripping the dry film off the film substrate to obtain a printed circuit board (PCB).