Ion Beam Profile Visualization Without Dose Calculation
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Solution Overview
Problem
Current treatment planning systems for particle therapy in oncology are hindered by time-consuming dose calculations, especially when adjusting ion beam parameters, which slows down the planning process and requires recalculating doses multiple times.
Innovation Solution
A method that generates and visualizes an ion beam profile based solely on the geometrical properties of the target region and incidence direction, eliminating the need for dose calculation, allowing for fast and reliable creation and verification of ion beam profiles, and can be applied to both two-dimensional and three-dimensional target regions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If dose calculation is performed to visualize ion beam characteristics, then measurement precision and reliability are improved, but productivity and speed are worsened due to time-consuming calculations
Solution Approach 1:
The patent creates a geometric copy or model of the ion beam profile based on target region geometry and incidence direction, rather than performing full dose calculations. This geometric model replicates the essential characteristics of the ion beam profile (orthographic projection, penetration depth) without requiring computationally intensive physics-based dose calculations, thus achieving fast visualization while maintaining accuracy.
Solution Approach 2:
The patent replaces the complex physics-based dose calculation mechanism with a simpler geometric projection mechanism. Instead of using computational algorithms to simulate particle interactions and energy deposition, the system uses geometric operations (orthographic projection, intersection calculations) to generate the ion beam profile, dramatically reducing computation time while preserving essential physical characteristics.
2Reliability
If dose calculation is performed multiple times to verify ion beam placement, then reliability is improved, but loss of time increases due to repeated recalculations
Solution Approach 1:
The patent performs preliminary geometric setup by defining the target region geometry and incidence direction once. This preliminary geometric model can then be rapidly re-projected for different viewing angles or parameter adjustments without requiring recalculation of the entire dose distribution. The geometric framework is established in advance, enabling fast iterative verification.
Solution Approach 2:
The patent creates reusable geometric copies of the ion beam profile from the single geometric model. When parameters need verification from different perspectives or with adjusted settings, the system generates new profiles by projecting the existing geometric model rather than recalculating from scratch, maintaining reliability through geometric consistency while minimizing time loss.
3Measurement precision
If complex dose calculation algorithms are used to reflect physical characteristics, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent replaces complex physics-based dose calculation algorithms with simpler geometric projection operations. The system uses orthographic projection mathematics and geometric intersection calculations instead of Monte Carlo simulations or analytical dose algorithms, reducing computational complexity while maintaining the ability to reflect essential physical characteristics of ion beam penetration and profile shape.
Solution Approach 2:
The patent extracts only the essential geometric characteristics needed for ion beam profile visualization (orthographic projection, penetration depth, profile shape) from the full dose calculation process. By taking out and focusing on these critical geometric elements, the system achieves accurate profile representation without requiring the full complexity of physics-based dose calculation algorithms.
Data Source
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AI summary
The invention relates to a method for generating and visualizing an ion beam profile, the method comprising the following steps: - Specifying an incidence direction (55) of a particle beam, - Specifying a target region (53) that is to be irradiated by said particle beam, - Creating an ion beam profile from points that are located on a downstream side (57) of said target region (53) or that are located in front of said target region (53) and project onto the contour of said target region (53) with respect to said incidence direction (55), - Displaying a graphical representation of said ion beam profile.