Ion Detector Architecture for Wide Dynamic Range Sensing

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Solution Overview

Problem

Current ion detectors face limitations in expanding their dynamic range, which is essential for effective detection of varying ion counts, as they often suffer from saturation issues at high ion levels and low sensitivity at low ion levels.

Innovation Solution

The ion detector incorporates a microchannel plate generating secondary electrons, a focus electrode to direct these electrons towards electron impact-type diodes with varying gains, and a voltage supply system that applies different drive voltages to these diodes to optimize detection across a wide range of ion counts.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a single electron impact-type diode is used for detection, then the device structure is simple, but the dynamic range is limited due to saturation at high ion levels and low sensitivity at low ion levels

Engineering Contradiction:
Improvedevice structureVSAvoiddetection sensitivity
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The single detection element is segmented into multiple electron impact-type diodes with different effective region areas. This segmentation allows each diode to specialize in detecting different ion flux ranges, with larger-area diodes handling high ion levels and smaller-area diodes detecting low ion levels, thereby expanding the overall dynamic range while maintaining manageable device complexity

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically switches between different diodes based on the ion flux level. The control unit selects which diode to activate depending on the detected ion count, enabling the system to adapt its sensitivity characteristics to match the current measurement conditions, thus resolving the contradiction between simple structure and detection precision across varying ion levels

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If multiple electron impact-type diodes with different effective region areas are used, then the dynamic range is expanded, but the device complexity increases

Engineering Contradiction:
Improvedynamic rangeVSAvoiddevice structure
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

Multiple diodes with different effective region areas are merged into a single integrated detection assembly, sharing common components such as the microchannel plate, focus electrode, and control unit. This merging approach expands the dynamic range through multi-area detection while minimizing the increase in overall device complexity by consolidating shared subsystems

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The system uses multiple copies of the electron impact-type diode structure, each with scaled effective region areas, arranged in an array. This copying strategy allows the system to achieve extended dynamic range coverage through geometric scaling rather than fundamentally different detection mechanisms, thereby expanding capability while controlling complexity through repetition of proven designs

Inventive Principle:
Principle #26Copying

3Measurement precision

If high gain is used to improve detection sensitivity for low ion levels, then low ion level detection is improved, but saturation occurs at high ion levels

Engineering Contradiction:
Improvedetection sensitivityVSAvoidsaturation resistance
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

Different regions of the detection system are assigned different quality characteristics: smaller-area diodes with higher effective gain are optimized for low ion level detection, while larger-area diodes with lower effective gain are optimized for high ion level detection. This local quality differentiation allows each region to excel at its specific detection range without suffering from the opposing limitation, resolving the contradiction between sensitivity and saturation resistance

Inventive Principle:
Principle #3Local quality

4Reliability

If low gain is used to prevent saturation at high ion levels, then high ion level detection is improved, but sensitivity decreases for low ion levels

Engineering Contradiction:
Improvesaturation resistanceVSAvoiddetection sensitivity
Core Design Contradiction:
ReliabilityVSMeasurement precision

Solution Approach 1:

The system changes the effective detection parameter (effective region area) based on the ion flux level. By selecting diodes with appropriate effective areas matched to the current ion count magnitude, the system optimizes the gain-to-saturation ratio for each measurement condition, thereby achieving both high sensitivity for low ions and saturation resistance for high ions through parameter adaptation rather than fixed design

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration allows for favorable detection results across a broader range of ion counts by utilizing high-gain diodes for low ion levels and low-gain diodes for high ion levels, effectively expanding the dynamic range and preventing saturation.

Implementation Method 1

a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon

Methodology Applied
Scientific EffectSecondary electron emission: Photoelectric Effect

Implementation Method 2

multiply and output the generated secondary electrons

Methodology Applied
Scientific EffectElectron avalanche multiplication: Electron Avalanche

Implementation Method 3

a focus electrode disposed between the microchannel plate and the electron impact-type diodes and configured to focus the secondary electrons toward the electron impact-type diodes

Methodology Applied
Scientific EffectElectrostatic focusing: Electrostatic Lens

Implementation Method 4

electron impact-type diodes having effective regions narrower than an effective region of the microchannel plate, configured to receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons

Methodology Applied
Scientific EffectElectron impact ionization: Electron Impact Desorption

Implementation Method 5

multiply and detect the incident secondary electrons

Methodology Applied
Scientific EffectAvalanche breakdown: Avalanche Breakdown

Data Source

PatentUS12074016B2Ion detector
Publication Date: 2024.08.27 HAMAMATSU PHOTONICS KK
  • US12074016B2 patent drawing
  • US12074016B2 patent drawing
  • US12074016B2 patent drawing

AI summary

An ion detector includes a microchannel plate configured to generate secondary electrons upon reception of ions incident thereon and multiply and output the generated secondary electrons; a plurality of electron impact-type diodes configured to have effective regions narrower than an effective region of the microchannel plate, receive the incident secondary electrons output from the microchannel plate, and multiply and detect the incident secondary electrons; a focus electrode configured to be disposed between the microchannel plate and the electron impact-type diodes and focus the secondary electrons toward the electron impact-type diodes; and a voltage supply part configured to apply a drive voltage to each of the plurality of electron impact-type diodes.