Measuring Ion Nonextensive Parameter via Geodesic Acoustic Mode

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Solution Overview

Problem

Current methods fail to accurately measure the ion nonextensive parameter of plasma, despite being able to measure the electron nonextensive parameter, leading to significant diagnosis errors due to the neglect of nonextensivity effects.

Innovation Solution

A method involving nonextensive statistical mechanics to derive an equation relating geodesic acoustic mode frequency and ion acoustic speed, followed by data collection and linear fitting to obtain the ion nonextensive parameter, utilizing a tokamak device and nonextensive electric probe, with additional steps for error analysis and validation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If nonextensive statistical mechanics is used to describe plasma, then measurement precision of ion nonextensive parameter is improved, but device complexity increases

Engineering Contradiction:
Improveion nonextensive parameter measurement precisionVSAvoidmeasurement device complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces complex direct measurement mechanisms with a theoretical modeling approach. By substituting the mechanical measurement system with a mathematical model based on nonextensive statistical mechanics that relates GAM frequency to ion acoustic speed, the method achieves high measurement precision while avoiding the need for complex additional hardware.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces geodesic acoustic mode (GAM) frequency as an intermediary parameter to measure the ion nonextensive parameter. Instead of directly measuring the ion nonextensive parameter, the method uses GAM frequency as a mediator that can be easily measured and then converted to the desired parameter through established theoretical relationships.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If traditional measurement methods are used, then device complexity is reduced, but diagnosis accuracy deteriorates due to neglect of nonextensivity effects

Engineering Contradiction:
Improvemeasurement device complexityVSAvoidplasma parameter diagnosis accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent changes the fundamental parameter description from Boltzmann-Gibbs statistics to nonextensive statistical mechanics. By adopting the q-indexed entropy framework and modifying the distribution functions accordingly, the method achieves accurate plasma parameter diagnosis that accounts for nonextensivity effects while using the same measurement devices.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS11856682B2Method for measuring plasma ion nonextensive parameter
Publication Date: 2023.12.26 NANCHANG UNIV
  • US11856682B2 patent drawing
  • US11856682B2 patent drawing
  • US11856682B2 patent drawing

AI summary

The present invention relates to a method for measuring the ion nonextensive parameter of plasma includes the following steps: describe the plasma with nonextensive statistical mechanics, obtain the equation describing the relationship between the geodesic acoustic mode frequency and the ion acoustic speed of plasma; collect the measurement data of the geodesic acoustic mode frequencies and plasma temperature in the device where the plasma is to be measured; the obtained equation describing the relationship between the geodesic acoustic mode frequency and the ion acoustic speed of plasma is used to linearly fit the collected measured data of the geodesic acoustic mode frequency and the plasma temperature in the device where the plasma is to be measured to obtain the slope value; based on the derived equation and the obtained slope values, and combining with the safety factor of the device where the plasma is to be measured, the ion nonextensive parameter is solved numerically. The present invention fills the gap where the electron nonextensive parameter can be measured with the nonextensive single electric probe, but the corresponding ion nonextensive parameter cannot be diagnosed yet in the field of nonextensive parameters diagnosis.