Ion Sensor Semiconductor Gate Insulation Access Area

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Solution Overview

Problem

Current methods for measuring mobile ion concentrations in liquid samples, such as those in the healthcare industry, are time-consuming and costly, requiring large and expensive equipment and specialized personnel.

Innovation Solution

A semiconductor sensor apparatus and method using a field effect transistor structure with an ion access area in the gate insulation, allowing direct contact with the sample, which measures changes in electric characteristics to determine ion concentration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If chromatographic or spectroscopic methods are used to measure ion concentration, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:
Improveion concentration measurement precisionVSAvoidapparatus complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the essential sensing function from complex chromatographic or spectroscopic systems by using only a semiconductor body with gate insulation and gate electrode. The ion detection capability is isolated into a simple field-effect transistor structure where ions in the sample directly modulate the electrical characteristics, eliminating the need for complex separation or detection apparatus while maintaining measurement precision

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent creates a simplified model of ion detection by using the electrical field interaction principle that mimics the detection capability of complex instruments. The field-effect transistor structure copies the essential measurement function (detecting ion presence through electrical property changes) without requiring the full complexity of chromatographic or spectroscopic systems

Inventive Principle:
Principle #26Copying

2Measurement precision

If chromatographic or spectroscopic methods are used to measure ion concentration, then measurement precision is improved, but cost increases

Engineering Contradiction:
Improveion concentration measurement precisionVSAvoidmanufacturing cost
Core Design Contradiction:
Measurement precisionVSEase of manufacture

Solution Approach 1:

The patent employs a disposable or low-cost semiconductor sensor that can be manufactured using standard semiconductor fabrication processes. The simple structure of the field-effect transistor sensor allows for mass production at low cost, making it economically viable for routine ion concentration measurements without requiring expensive specialized equipment

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Solution Approach 2:

The patent extracts only the essential sensing elements needed for ion detection, eliminating all costly auxiliary systems. The sensor uses a minimal structure (semiconductor body, gate insulation, gate electrode) that can be manufactured using conventional semiconductor processes, dramatically reducing production costs compared to chromatographic or spectroscopic instruments

Inventive Principle:
Principle #2Taking out (Extraction)

3Measurement precision

If chromatographic or spectroscopic methods are used to measure ion concentration, then measurement precision is improved, but time consumption increases

Engineering Contradiction:
Improveion concentration measurement precisionVSAvoidmeasurement time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces mechanical or chemical separation processes (chromatography) and complex spectroscopic analysis with a direct electrical field interaction method. Ions in the sample directly modulate the electrical characteristics of the field-effect transistor, providing immediate measurement without requiring time-consuming separation or multi-step analysis procedures

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Measurement precision

If specialized personnel are used to operate measurement equipment, then measurement precision is improved, but ease of operation worsens

Engineering Contradiction:
Improveion concentration measurement precisionVSAvoidoperation complexity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent creates a self-service measurement system where the semiconductor sensor automatically detects ion concentration through direct electrical property changes. The device requires no specialized operation skills, calibration, or complex procedure execution - the sensor simply interacts with the sample and provides measurement results, making it accessible to non-experts while maintaining precision

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables rapid and cost-effective detection of ion concentrations with high accuracy, capable of measuring down to ppm levels, specifically applicable for medical applications like potassium ion detection in blood samples.

Implementation Method 1

The gate insulation comprises at least one ion access area providing access for ions in the sample to the insulating layer

Methodology Applied
Scientific EffectIon access through gate insulation:

Implementation Method 2

determining a change in an electric characteristic of the field effect device structure, and determining the ion concentration based on the change in the electric characteristic

Methodology Applied
Scientific EffectField effect transistor electric characteristic change:

Data Source

PatentUS9599586B2Ion sensor
Publication Date: 2017.03.21 INFINEON TECHNOLOGIES AG
  • US9599586B2 patent drawing
  • US9599586B2 patent drawing
  • US9599586B2 patent drawing

AI summary

The disclosure describes techniques for determining an ion concentration in a sample. According to these techniques of this disclosure, an ion concentration of a sample is determined based on detecting at least one change in an electrical characteristic of a semiconductor device due to a gate insulation layer of the semiconductor device placed in contact with the sample.