Ion Source Sputter Coating for Mass Spectrometer Sensitivity

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Solution Overview

Problem

The sensitivity of mass spectrometers degrades over time due to dielectric deposits in the ion source, affecting ion behavior and leading to sensitivity loss, mass resolution, and ion abundance ratio issues.

Innovation Solution

Applying a conductive layer to the interior of the ion source using sputtering techniques with gases like argon, helium, or titanium nitride to form a conductive coating over non-conductive deposits, maintaining ion source robustness.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of information

If the ion source operates continuously for detailed analysis, then comprehensive qualitative and quantitative data can be obtained, but dielectric deposits build up on surfaces leading to sensitivity degradation

Engineering Contradiction:
ImprovesensitivityVSAvoidoperational duration
Core Design Contradiction:
Loss of informationVSDuration of action of stationary object

Solution Approach 1:

The patent applies a conductive coating to the ion source surfaces before dielectric deposits can accumulate to problematic levels. This preliminary protective action prevents the buildup from interfering with ion formation and extraction, thereby maintaining sensitivity over extended operational periods without requiring frequent interruptions for cleaning

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent converts the harmful insulating effect of dielectric deposits into a beneficial scenario by applying a conductive coating that actively counteracts the insulating effect. The conductive coating transforms the problematic interaction between dielectric deposits and electric fields into a controlled situation where the coating's conductivity compensates for the deposits' insulating properties, maintaining proper field distribution and ion extraction efficiency

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Duration of action of stationary object

If dielectric deposits accumulate on ion source surfaces, then operational time increases, but mass resolution and mass accuracy deteriorate due to altered electric fields

Engineering Contradiction:
Improveoperational timeVSAvoidmass resolution
Core Design Contradiction:
Duration of action of stationary objectVSMeasurement precision

Solution Approach 1:

The patent changes the electrical conductivity parameter of the ion source surfaces by applying a conductive coating. This parameter change ensures that even as dielectric deposits accumulate over time, the overall electrical properties of the ion source surfaces remain conductive, thereby maintaining the electric field distribution necessary for accurate mass resolution and measurement precision over extended operational periods

Inventive Principle:
Principle #35Parameter changes

3Duration of action of stationary object

If dielectric deposits form on the cavity and ion-optical components, then the ion source can continue operating, but ion abundance ratios are affected due to altered forces on ions

Engineering Contradiction:
Improvecontinuous operationVSAvoidion abundance ratio accuracy
Core Design Contradiction:
Duration of action of stationary objectVSReliability

Solution Approach 1:

The patent converts the harmful insulating effect of dielectric deposits on ion-optical components into a beneficial scenario by applying a conductive coating. This coating ensures that the electric fields used to guide and focus ions remain accurate despite the presence of dielectric deposits, thereby maintaining reliable ion abundance ratio measurements during continuous operation

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent changes the electrical conductivity parameter of the ion source and ion-optical component surfaces to counteract the insulating effect of dielectric deposits. This parameter change ensures that the forces acting on ions during extraction, guidance, and focusing remain consistent with design specifications, maintaining ion abundance ratio accuracy over time

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The conductive coating maintains ion source sensitivity and performance by counteracting the insulating effects of dielectric deposits, ensuring consistent mass spectrometer operation.

Implementation Method 1

Applying a conductive layer to the interior of the ion source using sputtering techniques with gases like argon, helium, or titanium nitride to form a conductive coating over non-conductive deposits

Methodology Applied
Scientific EffectSputtering: Sputtering

Data Source

PatentUS12444595B2Ion sources for improved robustness
Publication Date: 2025.10.14 THERMO FINNIGAN LLC
  • US12444595B2 patent drawing
  • US12444595B2 patent drawing
  • US12444595B2 patent drawing

AI summary

A mass spectrometer system includes a vacuum manifold; an ion source positioned within the vacuum manifold for ionizing a sample; a mass analyzer for analyzing sample ions; a high vacuum pump connected to the vacuum manifold operable to maintain the pressure within the vacuum manifold at an operating pressure; and a controller configured to raise the pressure in the ion source to a sputtering pressure by supplying a flow of a sputtering gas and either reducing a speed of a high vacuum pump or isolating the ion source from the high vacuum pump; cause a conducting material to be sputtered on a surface of the ion source; and reduce the pressure in the ion source to an operating pressure by reducing the flow of the sputtering gas and either increasing the speed of the high vacuum pump or restoring connectivity between the ion source and the high vacuum pump.