Ion Trap Mass Spectrometer Optical Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Current mass spectrometers lack efficient methods for selective mass analysis of ions using optical detection, particularly in commercial instruments, which limits resolution, mass accuracy, and detection limits.
Innovation Solution
The use of laser-induced fluorescence (LIF) or light scattering for optical measurement in ion traps, combined with efficient photon excitation and detection schemes, allows for simultaneous measurement of ion frequencies and intensity without ion ejection, using large trapping volumes and unique fluorescent tag molecules to enhance sensitivity and resolution.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional ionizing particle detectors or electrical image current measurement are used, then mass analysis can be performed, but resolution, mass accuracy, and detection limits are limited
Solution Approach 1:
The patent replaces conventional ionizing particle detectors or electrical image current measurement systems with an optical detection system. Ions are excited by laser light and their presence is detected through optical signals (fluorescence or light scattering), substituting mechanical/electrical detection with optical detection to achieve higher resolution and accuracy.
Solution Approach 2:
The patent utilizes optical properties of ions, specifically fluorescence emission or light scattering, to detect ion presence and characteristics. By exciting ions with laser light and detecting the resulting optical signals, the system achieves enhanced mass analysis capability through color/optical changes rather than electrical signals.
2Productivity
If ions are ejected from the trap for analysis, then detection can occur, but ion loss occurs and repetitive analysis is limited
Solution Approach 1:
The patent enables ions to be detected while remaining trapped in the ion trap through optical detection methods. The ions themselves serve as the detection target without needing to be ejected, allowing repetitive analysis of the same ion population and eliminating ion loss associated with ejection-based detection.
Solution Approach 2:
The patent replaces the mechanical ejection and external detection process with in-trap optical detection. By using laser excitation and optical signal detection within the trap, the system eliminates the need for ion ejection, enabling non-destructive, repetitive analysis of trapped ions.
3Measurement precision
If small trapping volumes are used, then device size is reduced, but sensitivity and resolution are decreased
Solution Approach 1:
The patent utilizes optical detection methods (fluorescence and light scattering) that are highly sensitive to ion presence. By detecting optical signals from excited ions, the system achieves high sensitivity and resolution even in smaller trapping volumes, as optical detection can detect individual ion events with high efficiency.
4Duration of action of moving object
If conventional detection methods are used, then analysis time is limited, but measurement precision can be maintained
Solution Approach 1:
The patent enables continuous optical detection of ions while they remain trapped, allowing for extended analysis times. The laser excitation and optical detection can operate continuously without interrupting ion trapping, enabling longer measurement durations while maintaining mass accuracy through sustained monitoring of ion optical signals.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach improves mass analysis resolution, accuracy, and sensitivity, enabling repetitive analysis of ions without loss and extending analysis time, while reducing noise interference, thereby overcoming limitations in existing technologies.
Implementation Method 1
The energy source 20 excites the ions in the ion trap 12 and the optical detector 22 detects photons emitted from the ions in the trap 12
Implementation Method 2
optical detector 22 detects photons emitted from the ions in the trap 12
Data Source
AI summary
Apparatus including an ion trap, a controller connected to the ion trap, wherein the controller includes a memory containing computer readable instructions which, when executed, cause the controller to send control signals to the ion trap so that the ion trap produce and maintain a trapping field in the ion trap, a waveform generator to change the trapping field so that ions of a predetermined mass in the trapping chamber are selectively moved; a secondary waveform generator to change the orbits of the ions; an energy source to excite ions to emit photons, an optical detector to detect the emitted photons, and a processor which can apply fast-Fourier transform analysis of the time-domain signal of the detected emitted photons to generate a frequency or mass spectrum related to mass-to-charge ratio of the ions.