Ion Trap Quadrupole Mass Filter Secondary Ion Filtering
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Solution Overview
Problem
Ion trap mass spectrometers face challenges in obtaining a pure mass spectrum due to secondary ions generated outside the ion trap, which cause background noise and reduce mass resolution and detection sensitivity.
Innovation Solution
Incorporating a secondary ion filter between the ion trap and detector to block secondary ions, ensuring only ions released from the ion trap reach the detector, by forming a quadrupole potential well and using a secondary ion filter with a plate-type ion filtering ring and end cap electrodes, and applying specific voltages to filter out secondary ions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If ions are accelerated at high voltage to reach the ion detector, then detection sensitivity is improved, but secondary ions are generated through ion-molecule collisions causing background noise and ion congestion
Solution Approach 1:
The patent segments the ion transmission path into distinct functional zones: the ion trap region for selective ion release, the acceleration region for kinetic energy impartment, and the field-free drift region for secondary ion filtering. This spatial segmentation allows ions to be accelerated to detection-sensitive velocities while secondary ions generated during flight are excluded from reaching the detector, as they lack the directional control and energy characteristics of primary ions from the trap.
Solution Approach 2:
The patent introduces an intermediary field-free drift region between the acceleration zone and the detector. This intermediary space allows primary ions to maintain their directed motion toward the detector while secondary ions, generated through collisions in this region, are prevented from reaching the detector due to their random trajectories and insufficient energy to overcome the potential barriers at the detector entrance.
2Object-generated harmful factors
If a middle electrode or ion lens is added to reduce secondary ion noise, then background noise is reduced, but device complexity increases
Solution Approach 1:
The patent extracts the secondary ion filtering function from the traditional electrode-based approach and implements it through the inherent physics of the field-free drift region. By removing the need for additional middle electrodes or complex ion lenses, the design achieves secondary ion rejection through the natural behavior of ions in a field-free environment, where only ions with proper directional momentum from the acceleration zone can reach the detector.
Solution Approach 2:
The field-free drift region serves multiple functions simultaneously: it allows primary ions to travel ballistically to the detector, provides space for controlled secondary ion generation that doesn't reach the detector, and acts as an inherent filter without requiring additional active components. The system uses the ions' own kinetic energy and trajectory properties to achieve separation, eliminating the need for external filtering electrodes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for the measurement of a pure mass spectrum with improved mass resolution and detection of trace amounts of ions, widening the signal detection range by preventing ion congestion and excluding background noise signals.
Implementation Method 1
an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter
Implementation Method 2
a quadrupole is formed in the center inside since the two end cap electrodes are connected to each other at the same potential
Implementation Method 3
the ions are trapped in the thus formed quadrupole
Implementation Method 4
forming a quadrupole potential well between an ion trap and an ion detector to prevent secondary ions, which are newly generated on a path out of an ion trap, from reaching the ion detector
Implementation Method 5
Here, electrons generated are amplified and then recorded as a current signal
Data Source
AI summary
An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.


