IQ Time-Domain Waveform Display on a Common Signal Axis
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Solution Overview
Problem
Frequency domain test and measurement instruments are deficient in presenting and manipulating downconverted time domain data, making it difficult to analyze and compare different types of time domain signals.
Innovation Solution
A test and measurement instrument that generates IQ-based time domain waveform information and presents it together with other time domain waveforms on a common axis through a user interface, allowing for adjustments of horizontal and vertical scales and positions, enabling visual comparison and manipulation of IQ-based and additional time domain waveforms.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If frequency domain test and measurement instruments are used to analyze modulated RF carriers, then frequency domain analysis capability is provided, but the ability to present and manipulate downconverted time domain data is deficient
Solution Approach 1:
The test and measurement instrument is designed to perform multiple functions: it can analyze signals in both the frequency domain (original capability) and the time domain (new capability). The controller generates IQ-based time domain waveforms from downconverted baseband component information and presents them on a common axis with other time domain waveforms, enabling the instrument to handle both frequency domain analysis and time domain manipulation versatility
2Productivity
If downconverted IQ baseband component information is generated from digitized RF signals, then frequency domain processing capability is utilized, but the presentation of time domain waveform information is difficult
Solution Approach 1:
The controller acts as an intermediary that transforms downconverted IQ baseband component information into IQ-based time domain waveforms. It performs the necessary signal processing operations to convert the processed baseband data into a time domain representation that can be displayed and manipulated alongside other time domain signals on a common axis
3Loss of information
If multiple types of time domain signals are to be compared, then comprehensive signal analysis is required, but the difficulty of presenting and comparing different types of time domain signals increases
Solution Approach 1:
The controller merges multiple types of time domain signals onto a single common display axis. It presents the IQ-based time domain waveform generated from downconverted baseband information together with other time domain waveforms (such as directly sampled time domain signals) on the same axis, enabling comprehensive signal analysis and comparison without requiring separate displays or complex switching between different signal types
Data Source
AI summary
A test and measurement instrument and method for generating IQ-based time domain waveform information and presenting the IQ-based time domain waveform information together with other time domain waveform on a common axis through a user interface. The test and measurement instrument can include, for example, one or more input terminals to receive an electrical signal under test, an analog-to-digital converter (ADC) to digitize the signal under test, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal, a memory configured to store the IQ baseband component information, a user interface, and a controller. The controller can be configured to generate an IQ-based time domain waveform using the IQ baseband component information, and present the IQ-based time domain waveform and a second time domain waveform on a common axis through the user interface.