IR Temperature Measurement with Self-Calibrating Reference Element

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current IR-radiation based temperature measurement methods face inaccuracies due to unknown emission levels and reflected radiation parameters, often relying on estimated values and specialized devices for emission level measurement, and lack efficient methods to correct for environmental reflections.

Innovation Solution

A method and device utilizing a reference element with high emissivity and reflectivity areas, allowing separate detection of IR-radiations from these areas and the object's surface, enabling automated measurement of emission levels and reflected radiation, with image processing for accurate identification and correction of temperature measurements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If emission levels and reflected radiation parameters are estimated using tables or specialized devices, then temperature measurement can be performed, but measurement accuracy deteriorates due to approximate values

Engineering Contradiction:
Improvetemperature measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The reference element enables the measurement system to determine its own calibration parameters (emission levels and reflected radiation) automatically during operation, eliminating the need for external specialized devices or manual table lookups. The system self-calibrates by measuring the known properties of the reference element's different surface areas.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The reference element utilizes surfaces with dramatically different radiative properties (high emission/low reflection versus low emission/high reflection) to create measurable parameter variations. By comparing IR radiation from these two surfaces, the system can mathematically determine the actual emission level and reflected radiation components for the object being measured.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If automated measurement of emission level and reflected radiation is implemented, then temperature measurement accuracy improves, but device complexity increases

Engineering Contradiction:
Improveemission level measurement accuracyVSAvoidmeasurement system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines the reference element with the object being measured, placing it in direct thermal contact. This merging allows the system to simultaneously measure both the object's temperature and its emission/reflected radiation parameters using a single integrated approach rather than requiring separate calibration devices and measurement procedures.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The reference element acts as an intermediary that provides known reference values for emission and reflected radiation. By measuring the IR radiation from the reference element's surfaces (which have known, contrasting properties) and comparing them to measurements from the object, the system can calculate the object's actual emission level and reflected radiation without requiring complex external calibration equipment.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Loss of information

If separate detection of IR-radiations from reference element areas and object surface is performed, then emissivity and reflected radiation determination becomes possible, but measurement system complexity increases

Engineering Contradiction:
Improveinformation about emission and reflectionVSAvoiddetection system complexity
Core Design Contradiction:
Loss of informationVSDevice complexity

Solution Approach 1:

The reference element is segmented into two distinct surface areas with contrasting radiative properties: one area with high emission/low reflection and another with low emission/high reflection. The detection system separately measures IR radiation from these two segments, allowing mathematical separation of the emission and reflected radiation components. This segmentation of the reference element into functionally different zones enables the extraction of multiple parameters (emissivity and reflected radiation) from a single measurement setup.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise, automated determination of object temperature by accurately measuring emission levels and correcting for environmental reflections, improving the reliability and accuracy of IR-radiation based temperature measurements.

Implementation Method 1

a reference element is made to contact the object in a heat-conducting fashion

Methodology Applied
Scientific EffectHeat conduction: Conduction (thermal)

Implementation Method 2

a first area with high emissivity and a second area with high reflectivity, that a first IR-radiation emitted from the first area of the reference element

Methodology Applied
Scientific EffectThermal radiation: Thermal Radiation

Implementation Method 3

a second area with high reflectivity, that a second IR-radiation emitted from the second area of the reference element

Methodology Applied
Scientific EffectReflection: Reflection

Implementation Method 4

a third IR-radiation emitted from a surface area of the object are detected separately

Methodology Applied
Scientific EffectThermal radiation: Thermal Radiation

Data Source

PatentUS8368021B2Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device
Publication Date: 2013.02.05 TESTO AG
  • US8368021B2 patent drawing
  • US8368021B2 patent drawing
  • US8368021B2 patent drawing

AI summary

In a temperature measuring device (1) an IR-radiation detector (2) and a reference element (3) are provided, connected to a surface (6) of an object (7) in a heat-conducting fashion, with a first area (4) with high emissivity and a second area (5) with high reflectivity formed at the reference element (3), and the IR-radiation detector (2) is equipped for a separate detection of IR-radiation (9, 10, 11) from the first and second areas (4, 5) and a surface area (12) of the object (7). A computer (13) in the IR-radiation detector (2) is equipped to deduct a temperature measurement for the object (7), corrected for emissions and reflections from the detected IR-radiations (9, 10, 11).