Redundant Pixel Architecture for ILED Display Repair
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Inorganic light emitting diode (ILED) displays face challenges in manufacturing smaller displays due to the difficulty in assembling and testing millions of pixels with standard techniques, and the inevitability of defective LED dies affects manufacturing yield, while also consuming significant battery power in portable devices.
Innovation Solution
The method involves creating sub-pixel assemblies with primary micro-LEDs, identifying and replacing defective micro-LEDs, and physically severing current paths to integrate additional replacement micro-LEDs, allowing for the creation of repaired sub-pixel assemblies with two defective and one operable micro-LEDs connected to separate branches of a current path, enhancing manufacturing efficiency and reducing power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If standard LED dies are used in ILED displays, then brightness and battery performance are improved, but manufacturing complexity and defect rates increase
Solution Approach 1:
The patent segments the pixel structure into multiple sub-pixel assemblies, each containing multiple micro-LEDs arranged in a matrix. This segmentation allows independent testing and replacement of individual micro-LEDs, reducing overall manufacturing complexity while maintaining high brightness through the collective emission of multiple LEDs per pixel.
Solution Approach 2:
The patent implements local quality control by enabling individual micro-LEDs within each sub-pixel assembly to be tested, identified as defective, and replaced independently. This localized approach to quality management reduces the impact of defects on the entire display, allowing high-brightness ILED displays to be manufactured with acceptable yield rates.
2Area of stationary object
If smaller pixel areas are used to reduce display size, then portability is improved, but assembly and testing difficulty increases
Solution Approach 1:
The patent divides each pixel into multiple sub-pixel assemblies with micro-LEDs arranged in matrices (e.g., 2x2, 3x3, or 4x4 configurations). This segmentation allows the use of smaller individual micro-LEDs that can be precisely placed in smaller pixel areas while maintaining manageable assembly and testing processes through modular construction.
Solution Approach 2:
The patent performs preliminary testing of individual micro-LEDs before final assembly into the display. Defective micro-LEDs are identified and replaced at the sub-pixel assembly level before integration into the complete display, facilitating easier manufacturing and repair of compact displays with smaller pixels.
3Productivity
If individual micro-LEDs are replaced in defective sub-pixel assemblies, then manufacturing yield is improved, but device complexity increases
Solution Approach 1:
The patent segments the pixel into multiple sub-pixel assemblies, each containing a matrix of micro-LEDs (e.g., 2x2, 3x3, or 4x4 arrangements). This segmentation enables individual micro-LEDs to be tested and replaced independently, improving manufacturing yield by allowing selective repair of only defective components rather than requiring replacement of entire pixels or assemblies.
Solution Approach 2:
The patent implements dynamic reconfigurability where sub-pixel assemblies can be reconfigured during manufacturing to accommodate defective micro-LEDs. The system allows for flexible assignment of operational micro-LEDs to replace defective ones within the same sub-pixel assembly, optimizing yield without requiring fixed, complex replacement procedures.
4Illumination intensity
If more micro-LEDs are placed per pixel, then brightness is improved, but power consumption increases
Solution Approach 1:
The patent implements local quality control at the micro-LED level within each sub-pixel assembly, allowing individual micro-LEDs to be tested and identified as defective before final assembly. This enables selective placement of only functional micro-LEDs, ensuring optimal brightness output while minimizing power consumption by eliminating defective LEDs that would waste energy without contributing to luminance.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the repair of inoperable sub-pixel assemblies and improves the manufacturing yield of ILED displays, reducing power consumption and extending battery life by utilizing redundant micro-LEDs in ILED displays.
Implementation Method 1
discrete standard LED dies that are made of inorganic materials are used to produce light
Implementation Method 2
Inorganic light emitting diode (ILED) displays can provide superior battery performance and enhanced brightness
Data Source
AI summary
Described herein are ILED displays including redundancy in micro-light emitting diode (micro-LED) dies and methods of manufacturing the ILED displays. A micro-LED die emits light of a particular wavelength. The redundancy is added during manufacturing if defective micro-LED dies are identified. Additional micro-LED dies are included in inoperable sub-pixel assemblies to repair the inoperable sub-pixel assemblies that are identified to include defective micro-LED dies. An ILED display therefore includes at least one repaired sub-pixel assembly that includes two defective micro-LED dies and an operable micro-LED die that are coupled to separate branches of a current path from a current source.