Submodule Interface Testing for Isolated Modular System Verification
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Solution Overview
Problem
Existing methods for testing subsystems in modular systems, such as train control systems, face challenges like difficulty in isolated testing due to interactions with the overall system, complex integration, and inefficient regression testing.
Innovation Solution
A method using an electronic computing device to identify and test a submodule based on a provided plan, stimulating it through its interfaces with test signals, allowing independent verification and validation, and simulating its behavior within the overall system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If subsystems are tested in isolation, then testing efficiency and reliability are improved, but the subsystem cannot be executed without interactions with the overall system
Solution Approach 1:
The patent introduces an intermediary testing system that acts as a mediator between the subsystem and the overall system. This testing system includes test signal generation units, signal routing components, and response analysis modules that enable isolated testing by simulating the behavior of other system components. The intermediary testing infrastructure allows the subsystem to be tested independently while maintaining the necessary interaction patterns through controlled test signals.
Solution Approach 2:
The patent creates simplified copies or models of the overall system's behavior and other subsystems' interfaces. These copies include simulated response generators that mimic the expected behavior of connected components, allowing the target subsystem to be tested in isolation with realistic interaction patterns. The copying approach enables regression testing and validation without requiring the complete physical system.
2Ease of manufacture
If Big Bang integration is used, then system integration is achieved, but stability of the overall system deteriorates due to multiple subsystems impacting each other
Solution Approach 1:
The patent applies segmentation by dividing the system integration process into distinct phases and levels. Testing is performed at multiple granularity levels starting from individual components, progressing to subsystems, and finally to the complete system. This segmented approach includes component-level testing, interface-level testing, subsystem-level testing, and system-level integration testing, allowing problems to be identified and resolved at appropriate levels without destabilizing the entire system.
Solution Approach 2:
The patent implements preliminary action by performing extensive testing and validation of individual subsystems and interfaces before integrating them into the complete system. Pre-integration testing includes verifying interface compatibility, validating communication protocols, and ensuring behavioral correctness of each component in isolation. This preliminary preparation prevents integration conflicts and maintains system stability during the integration process.
3Reliability
If regression testing is performed on a single subsystem, then changes are verified, but testing effort increases when multiple subsystems are affected
Solution Approach 1:
The patent extracts the regression testing capability into a reusable, independent testing framework that can be applied to any subsystem regardless of changes in other parts of the system. The testing framework includes parameterized test cases, configurable test environments, and automated test execution that can be selectively applied based on what has changed. This extraction allows regression testing to be performed efficiently on affected subsystems without requiring comprehensive re-testing of the entire system.
Data Source
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AI summary
The invention relates to a method for testing a submodule (10) of a modular system (12) having at least two submodules (10, 14, 16, 18) by means of an electronic computing device (20), comprising the steps of: providing a plan (22) characterizing the modular system (12) by means of the electronic computing device (20); (S1) identifying the submodule (10) to be tested as a function of the provided plan (22) by means of the electronic computing device (20); (S2) determining at least one interface (24, 26, 28) of the submodule (10) to be tested with the further submodule (14, 16, 18) by means of the electronic computing device (20); (S3) generating at least one test signal (30) for the submodule (10) to be tested by means of the electronic computing device (20); (S4) and testing the submodule (10) to be tested as a function of the test signal (30) and the specific interface (24, 26, 28) by means of the electronic computing device (20).(S5) Furthermore, the invention relates to a computer program product, a computer-readable storage medium and an electronic computing device (20).