Isolation Barrier Test Interface for Internal Node Probing
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Solution Overview
Problem
Integrated circuit testing and debugging are hindered by pin limitations in isolation products, which restrict visibility into receive dies, making it difficult to analyze failures without decapping, and even decapping provides limited internal node visibility.
Innovation Solution
A method and apparatus that enable diagnostic data transmission over an isolation channel to select and probe internal nodes on receive dies, allowing for enhanced testing and debugging without decapping, by using unlock codes and voltage level management to unlock diagnostic capabilities in both transmit and receive dies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If isolation products use pin-limited packages, then device integration is improved, but visibility into receive die internal nodes deteriorates
Solution Approach 1:
The patent introduces an intermediary diagnostic system consisting of a test interface and control logic that couples to the isolation product. This intermediary provides a communication pathway to the receive die internal nodes without requiring physical access through decapping, thereby maintaining pin-limited package benefits while enabling diagnostic capability.
Solution Approach 2:
The patent segments the diagnostic function into separate components: a test interface for external connection, a communication module for data transmission, and control logic for node selection. This segmentation allows the diagnostic system to be integrated without compromising the compact pin-limited package structure while providing access to internal nodes.
2Difficulty of detecting and measuring
If decapping is performed to access internal nodes, then visibility into internal nodes is improved, but device complexity and manufacturing difficulty increase
Solution Approach 1:
The patent implements a self-service diagnostic approach where the isolation product contains built-in diagnostic circuitry and control logic that enables self-testing and self-diagnosis. The system can identify and report internal node states without requiring external physical modification or complex decapping procedures, thereby maintaining device simplicity while improving visibility.
3Difficulty of detecting and measuring
If decapping is performed to access internal nodes, then visibility into internal nodes is improved, but ease of operation deteriorates
Solution Approach 1:
The patent implements preliminary action by pre-configuring diagnostic circuitry and control logic within the isolation product during manufacturing. The system is pre-prepared with the capability to respond to diagnostic commands and provide internal node information, eliminating the need for time-consuming decapping and manual probing operations.
Data Source
AI summary
An isolation system includes a transmit die and a receive die coupled by an isolation channel. The transmit die receives diagnostic data at an input terminal and transmits the diagnostic data over an isolation channel to a receive die. The receive die supplies a signal from an internal node in the receive die identified by the diagnostic data to an output terminal of the receive die. Other diagnostic data received by the transmit die causes the transmit die to supply a signal from an internal node in the transmit die to a terminal of the transmit die.