Image Signal Processor Anomaly Detection via Test Pattern Monitoring
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Solution Overview
Problem
Current methods for detecting anomalies in image signal processors (ISPs) in automatic driving systems fail to provide real-time monitoring and are resource-intensive, as they cannot effectively detect logic errors and require significant area resources.
Innovation Solution
A method and system for anomaly detection in ISPs that involves generating a test image following predetermined configuration rules, processing it with predetermined parameters, and detecting anomalies based on image configuration rule violations or cyclic redundancy check values, allowing for real-time monitoring without excessive resource consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If DFT logic is integrated into the chip during design for real-time anomaly detection, then the ability to detect anomalies improves, but the device complexity and area resources increase
Solution Approach 1:
The patent extracts the anomaly detection function from a separate test system and integrates it directly into the image signal processor's internal structure. The detection logic is embedded within the ISP's existing data paths, allowing the processor to monitor its own operations without requiring external testing equipment or additional complex test infrastructure.
Solution Approach 2:
The patent makes the image signal processor multi-functional by enabling it to perform both its primary image processing function and anomaly detection function simultaneously. The same processing units that handle normal image data are also used to process test patterns and generate detection results, eliminating the need for dedicated test hardware.
2Reliability
If redundancy design technology is used to detect logic errors in the chip, then the reliability improves, but the area resources and cost increase significantly
Solution Approach 1:
The patent changes the operational parameters of the image signal processor by introducing specific test patterns with known characteristics and comparing the actual output against expected results. Instead of adding redundant hardware structures, the system uses parameter-based verification by monitoring whether the processor's output matches predetermined expectations for given input patterns.
Solution Approach 2:
The patent creates a virtual model of the expected processing behavior by storing predetermined results for known test patterns. The actual processor output is then compared against this copied reference data to detect anomalies, eliminating the need for physical redundancy while maintaining detection capability.
3Reliability
If parity or ECC technology is used to detect errors, then the reliability improves, but the capability to detect logic errors is limited and area resources increase
Solution Approach 1:
The patent implements a dynamic detection approach where the system actively processes test patterns and monitors the processor's response in real-time. Unlike static parity or ECC checking that only detects certain error types, this dynamic method can detect logic errors by observing whether the processor produces expected outputs for known inputs, adapting to various error manifestations.
Solution Approach 2:
The patent establishes a feedback loop where the processor's output is continuously monitored and compared against expected results. When deviations are detected, the system can trigger alerts or corrective actions. This feedback mechanism enables real-time detection of logic errors that would not be caught by traditional one-time parity or ECC checking.
4Manufacturing precision
If traditional testing methods are used before chip manufacturing, then the manufacturing precision improves, but the real-time monitoring capability during operation is lost
Solution Approach 1:
The patent performs preliminary actions by embedding detection logic and storing reference data during the chip design phase. Test patterns and expected results are prepared in advance and stored within the processor, enabling immediate anomaly detection as soon as the chip begins operation without requiring external testing equipment.
Solution Approach 2:
The patent enables the image signal processor to monitor and test itself autonomously. The processor uses its own internal resources to generate test patterns, process them, and compare results against expected outcomes. This self-service capability allows real-time functional safety monitoring without requiring external testing infrastructure during operation.
Data Source
AI summary
An anomaly detection method and system for image signal processor are disclosed. The anomaly detection method includes the followings. A test image following a predetermined image configuration rule is generated. The test image is provided to an image signal processor. The predetermined first image processing parameters for processing the test image are provided to the image signal processor. And the processed test images are detected to determine whether there are anomalies in the image signal processor. The processed test images are an images output after the image signal processor processes the test image based on the first image processing parameters.