Hardware-Controlled IST Parameter Updates Without Reboot

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Solution Overview

Problem

Conventional in-system test (IST) methods require system reboots to change operating parameters, leading to increased latency and reduced reliability due to power cycling, and are inadequate for detecting latent defects in hardware components over time.

Innovation Solution

A method for hardware-controlled updating of physical operating parameters, such as supply voltage or clock speed, during IST, allowing for continuous testing without rebooting, using an IST controller to adjust parameters based on test results and reduce test duration.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If system reboot is performed to change operating parameter values for IST, then test coverage is improved, but test latency increases and reliability decreases

Engineering Contradiction:

Improvetest coverageVSAvoidtest latency

Core Design Contradiction:

Adaptability or versatilityVSLoss of time

Solution Approach 1:

The patent applies preliminary action by pre-configuring multiple operating parameter sets (voltage, frequency, temperature) and their corresponding test patterns in memory before IST execution. The IST controller can directly select and apply these pre-prepared configurations without requiring system reboot, thereby maintaining comprehensive test coverage while eliminating the time penalty of parameter changes.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent introduces an IST controller as an intermediary component that mediates between the test requirements and the hardware component. This controller manages parameter changes and test execution independently, allowing operating parameter values to be modified during testing without triggering system-wide reboots, thus reducing test latency while preserving adaptability.

Inventive Principle:

Principle #24Intermediary (Mediator)

2Adaptability or versatility

If system reboot is performed to change operating parameter values for IST, then test coverage is improved, but system reliability decreases

Engineering Contradiction:

Improvetest coverageVSAvoidsystem reliability

Core Design Contradiction:

Adaptability or versatilityVSReliability

Solution Approach 1:

By pre-configuring multiple operating parameter sets and their corresponding test patterns in memory before IST execution, the system can switch between different testing conditions without performing power-cycling reboots. This maintains comprehensive test coverage while avoiding the reliability degradation associated with repeated system reboots.

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The IST controller serves as an intermediary that enables parameter changes during testing without requiring system reboots. It independently manages the selection and application of different operating parameter sets, thereby maintaining system reliability while achieving comprehensive test coverage through multiple parameter variations.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Measurement precision

If IST is executed for different values of supply voltage to identify Vmin, then detection precision is improved, but test duration increases

Engineering Contradiction:

Improvedetection precisionVSAvoidtest duration

Core Design Contradiction:

Measurement precisionVSDuration of action of moving object

Solution Approach 1:

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The patent enables continuous testing across different operating parameter values by eliminating the need for system reboots between parameter changes. The IST controller seamlessly transitions between different voltage, frequency, and temperature settings, maintaining continuous test execution and significantly reducing the total test duration while preserving detection precision.

Inventive Principle:

Principle #20Continuity of useful action

4Adaptability or versatility

If system reboot is performed during IST, then operating parameter changes are achieved, but power cycling reduces reliability

Engineering Contradiction:

Improveparameter change capabilityVSAvoidreliability

Core Design Contradiction:

Adaptability or versatilityVSReliability

Solution Approach 1:

Inventive Principle:

Principle #24Intermediary (Mediator)

Solution Approach 2:

Inventive Principle:

Principle #10Preliminary action

Data Source

PatentUS11494370B2Hardware-controlled updating of a physical operating parameter for in-field fault detection

Publication Date: 2022.11.08 NVIDIA CORP

AI summary

Latency of in-system test (IST) execution for a hardware component of an in-field (deployed) computing platform may be reduced when a value of a physical operating parameter can be changed without rebooting the computing platform. A test (e.g., patterns or vectors) is executed for varying values of the physical operating parameter (e.g., supply voltage, clock speed, temperature, noise magnitude/duration, operating current, and the like), providing the ability to detect faults in the hardware components.