Low-Resolution Measurement Correction Through Iterative Perturbation

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Solution Overview

Problem

Existing systems fail to accurately test the normality of low-resolution measurements due to inherent resolution limits of measurement devices, leading to false rejections of distribution assumptions and increased costs, especially in sensitive applications like medical device testing.

Innovation Solution

A method that reintroduces variation into low-resolution measurements by iteratively computing perturbed values until a stability criterion is met, allowing for higher resolution and accurate distribution testing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If low-resolution measurements are used due to measurement device limitations, then device complexity and cost are reduced, but measurement precision and accuracy of distribution testing deteriorate

Engineering Contradiction:
Improvemeasurement device complexityVSAvoidmeasurement resolution
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The patent introduces an intermediary computational process that takes low-resolution measurements as input and generates perturbed values with higher resolution through iterative computation. This intermediary system (the correction algorithm) bridges the gap between the limited measurement device and the requirement for high-resolution distribution testing, allowing accurate statistical analysis without needing expensive high-resolution measurement equipment.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If low-resolution measurements are used to reduce costs, then manufacturing cost is reduced, but reliability of distribution assumptions deteriorates due to false rejections

Engineering Contradiction:
Improvemanufacturing costVSAvoidreliability of distribution assumptions
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the iterative computation process continuously refines the perturbed values by comparing statistical properties and adjusting the resolution enhancement accordingly. The system uses distribution testing feedback to determine when the correction process has achieved sufficient accuracy, allowing reliable distribution assumptions to be made about the underlying high-resolution measurements without requiring actual high-resolution measurement equipment.

Inventive Principle:
Principle #23Feedback

3Measurement precision

If iterative computation is performed to enhance resolution of low-resolution measurements, then measurement precision is improved, but computing time and processing complexity increase

Engineering Contradiction:
Improveeffective measurement resolutionVSAvoidcomputing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent applies partial action by performing iterative computation only to the extent necessary to achieve sufficient resolution enhancement for distribution testing. Rather than attempting to perfectly reconstruct the original high-resolution measurements, the method performs just enough iterative refinement to restore the statistical properties needed for reliable normality testing, thereby avoiding unnecessary computing time while still achieving the required measurement precision for the statistical analysis.

Inventive Principle:
Principle #16Partial or excessive action

Data Source

PatentUS12461989B2Correcting low-resolution measurements
Publication Date: 2025.11.04 MINITAB INC
  • US12461989B2 patent drawing
  • US12461989B2 patent drawing
  • US12461989B2 patent drawing

AI summary

Methods and systems to correct low-resolution measurements corresponding to unobservable high-resolution measurements by introducing variation in the plurality of low-resolution measurements through iteratively computing, until a termination criteria is met, perturbed values for the low-resolution measurements. The perturbed values have a higher resolution than another resolution of the low-resolution measurements. A distribution test may afterwards be performed on the perturbed values that remain after the termination criteria is met.