Janus Abrasive Slurry for CMP Scratch and Agglomeration Control

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Solution Overview

Problem

Existing chemical mechanical polishing (CMP) processes face challenges in achieving high polishing efficiency while minimizing defects such as scratches, particularly due to agglomeration of abrasive particles, which can lead to foreign substances and reduced polishing speed.

Innovation Solution

A slurry composition containing Janus abrasive particles with hydrophobic and hydrophilic areas, allowing for anisotropic orientation and reduced agglomeration, is used in CMP processes. These particles are manufactured with a core particle coated by a hydrophobic and hydrophilic coating, enabling controlled orientation and efficient polishing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional abrasive particles are used in CMP processes, then polishing can be performed, but agglomeration of particles occurs leading to scratches and reduced polishing efficiency

Engineering Contradiction:
Improvepolishing efficiencyVSAvoidscratches and defects
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The abrasive particles are designed with Janus structure, where one hemisphere has hydrophobic properties and the other has hydrophilic properties. This local differentiation in surface properties prevents agglomeration by ensuring uniform orientation on the polishing pad, thereby reducing scratches while maintaining high polishing efficiency

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The abrasive particles exhibit asymmetric structure with distinct hydrophobic and hydrophilic hemispheres. This asymmetry enables controlled orientation during polishing, preventing random aggregation and ensuring consistent contact with the polishing pad, which eliminates scratches without compromising productivity

Inventive Principle:
Principle #4Asymmetry

2Productivity

If abrasive particles are used to achieve high polishing speed, then productivity improves, but particle agglomeration occurs reducing polish uniformity

Engineering Contradiction:
Improvepolishing speedVSAvoidpolish uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

By endowing different hemispheres of the abrasive particles with distinct wettabilities (hydrophobic vs. hydrophilic), the particles achieve uniform orientation on the polishing pad surface. This local property differentiation ensures consistent polishing action across all particles, maintaining both high speed and uniformity

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The invention changes the surface energy parameters of the abrasive particles by applying hydrophobic and hydrophilic coatings to different hemispheres. This parameter modification controls particle orientation and distribution, enabling high polishing speed while maintaining uniformity through prevented agglomeration

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The Janus abrasive particles reduce scratches and enhance polishing efficiency by minimizing agglomeration, ensuring effective polishing of semiconductor surfaces with improved orientation and controlled behavior.

Implementation Method 1

each of the plurality of Janus abrasive particles have a hydrophobic area and a hydrophilic area defined by the first and second coating portions

Methodology Applied
Scientific EffectHydrophobic effect: Hydrophobe

Implementation Method 2

each of the plurality of Janus abrasive particles have a hydrophobic area and a hydrophilic area defined by the first and second coating portions

Methodology Applied
Scientific EffectHydrophilic effect: Hydrophile

Data Source

PatentUS20250250464A1Janus abrasive particles and slurry composition comprising the same for chemical mechanical polishing
Publication Date: 2025.08.07 SAMSUNG ELECTRONICS CO LTD
  • US20250250464A1 patent drawing
  • US20250250464A1 patent drawing
  • US20250250464A1 patent drawing

AI summary

A slurry composition used for chemical mechanical polishing includes a plurality of Janus abrasive particles; and a solvent in which the plurality of Janus abrasive particles are dispersed, wherein each of the plurality of Janus abrasive particles includes: a core particle; a first coating portion on a surface of the core particle; and a second coating portion on the surface of the core particle, wherein the each of the plurality of Janus abrasive particles has a hydrophobic area and a hydrophilic area defined by the first and second coating portions.