Jitter Clock Pattern Switching for USB4 Receiver Frequency Tests
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Solution Overview
Problem
Existing signal generation apparatuses fail to complete the switching of patterns in time for Receiver Frequency variation tests as defined in the USB4 v2 Gen4 standard, and users face difficulties in setting correct test sequence parameters, leading to incorrect test results and inefficient debugging.
Innovation Solution
A signal generation apparatus with a clock source, jitter modulation source, and signal generation source, along with an operation unit, to generate and manage time series pattern signals according to the USB4 v2 Gen4 standard, allowing manual or automatic switching and highlighting critical test sequence parameters.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If pattern switching is performed using conventional signal generation apparatuses, then the test can be executed, but the switching cannot be completed in time for the Receiver Frequency variation test
Solution Approach 1:
The apparatus pre-configures multiple pattern signals and their corresponding transmission times in advance. The control unit automatically selects and switches between pre-prepared patterns based on the test sequence requirements, eliminating the need for real-time pattern generation and switching during the test execution.
Solution Approach 2:
The system dynamically adjusts the transmission time of each pattern signal based on the test sequence flow. The control unit modifies the timing parameters in real-time to match the required test protocol, allowing flexible adaptation to different test scenarios while maintaining precise timing control.
2Manufacturing precision
If frequency deviation amount is set to change several usec after pattern switching, then the test requirements are met, but the operation cannot be realized with current mechanisms
Solution Approach 1:
The system replaces manual mechanical timing adjustments with automated electronic control. The control unit precisely manages the timing between pattern switching and frequency deviation changes through software-based timing mechanisms, achieving microsecond-level precision without manual intervention.
Solution Approach 2:
The apparatus automatically changes the frequency deviation parameter at the precise moment required by the test sequence. The control unit modifies the frequency deviation amount and timing parameters dynamically, ensuring that the frequency change occurs exactly several usec after pattern switching as required by the test protocol.
3Ease of operation
If test sequence parameters are not clearly displayed, then the apparatus structure remains simple, but users cannot ascertain the configuration leading to incorrect test results
Solution Approach 1:
The display interface is segmented into multiple clear sections, with each section displaying specific test sequence parameters separately. The control unit presents the test sequence configuration in an organized, hierarchical manner, making it easy for users to understand and verify each parameter without confusion.
Solution Approach 2:
The display unit uses color coding to highlight critical test sequence parameters and indicate their current status. Important parameters such as transmission time, frequency deviation amount, and pattern type are displayed with distinct visual indicators, making them easily identifiable and verifiable by users.
Data Source
AI summary
A clock source configured to generate a clock of a reference frequency; a jitter modulation source configured to generate a jitter clock by applying a modulation to the clock of the reference frequency generated by the clock source; a signal generation source configured to generate a time series pattern signal of a Test Flow at a timing of the jitter clock in order to perform a test; and an operation unit configured to set a type of pattern for each flow of the time series pattern signal, a manual or automatic switching method for each flow, and a transmission time of a pattern for each flow in the automatic switching method in a pattern setting list in tabular form, in which the time series pattern signal of the Test Flow is transmitted to a device under test W in accordance with the settings of the operation unit.