Data-Dependent Jitter Injection in Automatic Test Equipment
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Solution Overview
Problem
Current automatic test equipment (ATE) systems lack the capability to effectively introduce data-dependent jitter into test signals with sub-user interval precision, which is essential for analyzing the tolerance of devices under test to this specific type of jitter.
Innovation Solution
The method involves generating a test pattern with redundant samples based on the frequency difference between the tester and the device under test, and digitally modifying this pattern to introduce data-dependent jitter by replacing samples within intervals, using algorithms stored in the tester's memory or applied in real-time, to create a modified test pattern that includes data-dependent jitter.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If current ATE systems are used to introduce data-dependent jitter, then the testing capability is limited, but the precision of jitter introduction is insufficient
Solution Approach 1:
The test pattern is divided into multiple intervals with redundant samples, allowing precise manipulation of individual samples to introduce data-dependent jitter with sub-user interval precision. Each interval contains multiple samples that can be selectively modified to create controlled jitter effects.
Solution Approach 2:
The patent introduces a new dimension of control by operating at a higher frequency than the DUT, creating redundant time samples within each user interval. This frequency dimension enables precise jitter injection that was previously unavailable in conventional ATE systems.
2Measurement precision
If the operating frequency of the tester is increased to achieve sub-user interval precision, then the jitter introduction precision is improved, but the complexity of the system increases
Solution Approach 1:
The patent replaces complex hardware jitter injection mechanisms with digital signal processing. By using software-based algorithms to manipulate test pattern samples, the system achieves precise jitter introduction without requiring additional complex hardware circuitry.
Solution Approach 2:
Redundant samples are created as copies within each interval, allowing the system to work with multiple representations of the same data. This copying approach enables precise jitter manipulation while maintaining the original test pattern integrity and simplifying the control logic.
3Reliability
If data-dependent jitter is introduced without redundant samples, then the testing process is simpler, but the repeatability of testing conditions is reduced
Solution Approach 1:
Redundant samples are pre-generated in the test pattern before actual testing begins. This preliminary creation of multiple samples per interval allows for consistent, repeatable jitter injection across multiple test cycles, as the same sample manipulation can be repeatedly applied.
Solution Approach 2:
The patent changes the temporal parameter structure by introducing redundant samples at a higher frequency. This parameter change from 1:1 sampling to multi-sample intervals enables precise control of jitter characteristics while ensuring repeatable testing conditions through consistent sample manipulation.
Data Source
AI summary
Methods, system, and computer programs for compensating for introducing data dependent jitter into a test signal using a testing instrument are disclosed. The method includes generating a test pattern that comprises a plurality of intervals. Each of the intervals includes a number of redundant samples that correspond to a sample in a test source pattern. The test pattern is digitally modified to generate a modified test pattern that includes data dependent jitter.