Built-in Jitter Loading and SOP Generation for Optical Transceiver Characterization
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Solution Overview
Problem
Current methods for characterizing jitter in optical transceivers are inefficient due to the need for external, costly, and bulky test equipment, which are difficult to calibrate and integrate into high-speed optical networks, especially in submarine applications where stringent jitter control is crucial for maintaining transmission reliability.
Innovation Solution
A system with integrated circuitry in optical transmitters and receivers that injects a test stimulus to characterize jitter, using a Phase Lock Loop (PLL) and Phase Interpolator to generate deterministic jitter, allowing for built-in, low-cost, and low-power jitter loading and State of Polarization (SOP) injection, enabling characterization of jitter tolerance and SOP transient operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external test equipment is used to characterize jitter, then measurement capability is provided, but device complexity, cost, and space requirements increase
Solution Approach 1:
The optical transceiver performs self-characterization by including built-in jitter loading circuitry and SOP generation capabilities. The device uses its own internal resources (PLL circuits, phase interpolators, electro-optic modulators) to generate test stimuli and measure jitter tolerance without requiring external test equipment.
Solution Approach 2:
The optical transceiver is designed to perform both its primary communication function and self-characterization functions. The same hardware components (transmitter PLL, receiver PLL, phase interpolators, electro-optic modulators) are used for both data transmission and jitter/SOP testing, eliminating the need for separate dedicated test equipment.
2Measurement precision
If external test equipment is used to characterize jitter, then measurement capability is provided, but cost increases
Solution Approach 1:
The optical transceiver performs self-characterization by including built-in jitter loading circuitry and SOP generation capabilities. The device uses its own internal resources (PLL circuits, phase interpolators, electro-optic modulators) to generate test stimuli and measure jitter tolerance without requiring external test equipment.
3Measurement precision
If external test equipment is used to characterize jitter, then measurement capability is provided, but physical space requirements increase
Solution Approach 1:
The optical transceiver performs self-characterization by including built-in jitter loading circuitry and SOP generation capabilities. The device uses its own internal resources (PLL circuits, phase interpolators, electro-optic modulators) to generate test stimuli and measure jitter tolerance without requiring external test equipment.
4Measurement precision
If conventional external test modules are used, then jitter testing is possible, but calibration and integration complexity increase
Solution Approach 1:
The optical transceiver performs self-characterization by including built-in jitter loading circuitry and SOP generation capabilities. The device uses its own internal resources (PLL circuits, phase interpolators, electro-optic modulators) to generate test stimuli and measure jitter tolerance without requiring external test equipment.
5Adaptability or versatility
If built-in jitter loading circuitry is integrated in the transmitter, then test stimulus generation is enabled, but device complexity increases
Solution Approach 1:
The optical transceiver is designed to perform both its primary communication function and self-characterization functions. The same hardware components (transmitter PLL, receiver PLL, phase interpolators, electro-optic modulators) are used for both data transmission and jitter/SOP testing, eliminating the need for separate dedicated test equipment.
Solution Approach 2:
The jitter loading circuitry is pre-integrated into the transmitter during manufacturing, so that when the device is deployed, the capability to generate test stimuli and characterize jitter is already in place. This preliminary integration eliminates the need for field-based calibration or complex setup procedures.
6Measurement precision
If deterministic jitter is generated using PLL and Phase Interpolator, then high-resolution characterization is achieved, but circuit complexity increases
Solution Approach 1:
The optical transceiver is designed to perform both its primary communication function and self-characterization functions. The same hardware components (transmitter PLL, receiver PLL, phase interpolators, electro-optic modulators) are used for both data transmission and jitter/SOP testing, eliminating the need for separate dedicated test equipment.
Data Source
AI summary
An optical system includes a transmitter including transmitter circuitry configured to cause transmission of a transmitted optical signal over a fiber link on an X polarization and a Y polarization; and a receiver including receiver circuitry configured to receive a received optical signal from the fiber link on the X polarization and the Y polarization, wherein the transmitter circuitry is configured to cause State of Polarization (SOP) changes on the X polarization and the Y polarization for a test of the fiber link. The transmitter circuitry and the receiver circuitry are built-in with the transmitter and the receiver, respectively, for performance of the test.