Jitter Measurement Circuit Using Multiplexer and Feedback Loop
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Solution Overview
Problem
Existing jitter measurement methods require additional semiconductor pins, complicating the circuit and increasing measurement costs.
Innovation Solution
A jitter measurement circuit that includes a multiplexer, detecting circuit, adder, integrating circuit, feedback circuit, and comparator, allowing for adjustable measurement frequency and reduced pin requirements.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate equipment is used to measure jitter, then measurement accuracy is improved, but device complexity and cost increase
Solution Approach 1:
The patent combines the jitter measurement function with the existing semiconductor device internal circuits. The measurement circuit is integrated within the device, sharing resources with other circuit components, thereby avoiding the need for separate external measurement equipment and reducing overall device complexity while maintaining measurement accuracy
Solution Approach 2:
The measurement circuit is designed to perform multiple functions within the semiconductor device. It can measure jitter of different signals (input signal, first comparison signal, second comparison signal) and operates across multiple frequency regions by switching between different comparison signals, providing universal measurement capability without requiring separate dedicated equipment for each function
2Measurement precision
If separate equipment is used to measure jitter, then measurement capability is improved, but manufacturing cost increases
Solution Approach 1:
By merging the jitter measurement function into the existing semiconductor device structure, the patent eliminates the need for additional separate measurement equipment. This integration reduces the total component count and assembly requirements, directly lowering manufacturing costs while preserving full jitter measurement capability
Solution Approach 2:
The semiconductor device performs self-measurement of its own signal jitter through the integrated measurement circuit. This self-service capability removes the dependency on external measurement equipment, reducing both manufacturing complexity and cost while maintaining accurate jitter measurement functionality
3Device complexity
If fixed frequency measurement is used, then circuit simplicity is maintained, but adaptability decreases
Solution Approach 1:
The measurement circuit incorporates dynamic adaptability through a multiplexer that can switch between different comparison signals (first comparison signal, second comparison signal) based on the measurement requirements. This dynamic switching capability allows the circuit to adapt to different frequency regions and measurement scenarios while maintaining a relatively simple base circuit structure
Solution Approach 2:
The circuit changes its operational parameters by selecting different comparison signals with different frequencies. By varying the frequency parameters of the comparison signals, the measurement circuit can adapt to measure jitter across different frequency regions without requiring a completely different circuit design for each frequency range
Data Source
AI summary
A jitter measurement circuit for measuring a jitter of an input signal, the jitter measurement circuit including: a multiplexer configured to output a first comparison signal or a second comparison signal in response to an output signal; a detecting circuit configured to output a detection signal corresponding to a phase difference between an output of the multiplexer and the input signal; a first adder configured to sum the detection signal and a feedback signal; an integrating circuit configured to integrate and output an output of the first adder; a feedback circuit configured to trim an output of the integrating circuit to generate the feedback signal; and a comparator configured to generate an output signal by comparing the output of the integrating circuit with a reference potential.