Joint Resistance Measurement Using Internal Temperature Estimation

The patent introduces an intermediary approach by using resistance value measurements as a proxy for temperature measurement. Instead of directly measuring temperature with a radiation thermometer (which fails on low-emissivity metals), the system measures resistance values at known temperatures, stores these relationships, and then uses resistance measurements to infer temperature. This intermediary resistance-based method bypasses the emissivity problem entirely.

The patent replaces the optical/radiation-based temperature measurement system with an electrical resistance-based system. By substituting the radiation thermometer (optical method) with resistance measurements (electrical method), the system eliminates the dependency on thermal radiation and emissivity properties, achieving accurate temperature inference through electrical properties instead.

The patent implements a feedback mechanism by continuously measuring resistance values and using them to infer temperature through pre-stored resistance-temperature relationships. This feedback loop allows the system to self-correct temperature data based on actual resistance measurements, ensuring accurate temperature correction for joint state determination without relying on external temperature sensors.

The patent performs preliminary action by pre-storing resistance value and temperature relationship data before actual joint measurement. This calibration phase establishes the resistance-temperature correspondence that enables accurate temperature inference during subsequent measurements, ensuring temperature correction accuracy is built into the system beforehand rather than calculated in real-time during joint inspection.