Key Generation Unit Physical Unclonable Function Scan Timing
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing key generation technologies in hardware security protection architectures face challenges in generating unique keys without affecting the timing of scan verification, particularly when using combinational logic circuits in circuit systems designed for testability.
Innovation Solution
The proposed solution involves a key generation unit with a physical unclonable function that utilizes existing combinational logic circuits in a circuit system to generate multiple key values without adding additional combinational logic circuits to the original path of scanning flip-flops, thereby avoiding timing errors during scan verification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If combinational logic circuits are added between scanning flip-flops to generate unique keys, then key uniqueness and security are improved, but timing errors during scan verification occur
Solution Approach 1:
The patent extracts the key generation function from the original combinational logic circuit path and relocates it to a separate key generation unit. The original combinational logic circuits are removed from between the scanning flip-flops, while a new key generation unit is introduced that uses the same combinational logic circuits but in a different configuration that does not interfere with scan verification timing.
Solution Approach 2:
The patent segments the circuit functionality by separating the scan verification path from the key generation path. The scanning flip-flops remain dedicated to scan verification, while a separate key generation unit utilizes the combinational logic circuits to generate keys. This segmentation allows both functions to operate independently without timing conflicts.
2Adaptability or versatility
If combinational logic circuits are integrated into the scanning flip-flop path, then key generation capability is improved, but scan verification timing is disrupted
Solution Approach 1:
The patent introduces a key generation unit as an intermediary component that mediates between the combinational logic circuits and the scanning flip-flops. This intermediary unit captures the output of the combinational logic circuits at appropriate timing points and stores it in dedicated storage elements, preventing direct interference with the scan verification timing while still enabling key generation.
Solution Approach 2:
The patent performs preliminary action by capturing the combinational logic circuit outputs at specific timing points before they can affect the scan verification process. The key generation unit samples and stores these outputs during initialization or setup phases, ensuring that the scan verification timing remains unaffected during normal operation.
Data Source
AI summary
A key generation technology of the present disclosure does not additionally set a combinational logic circuit on an original path of a scanning flip-flop, but utilizes a plurality of existing combinational logic circuits in a circuit system to generate multiple values of a key. Correspondingly, a key generation unit used in the key generation technology has two data flip-flops. One of the data flip-flops is used as a data flip-flop in one of a plurality of scanning flip-flops. The other data flip-flop is to obtain a node data signal of a node in the corresponding combinational logic circuit as one of the values of the key.


