Key Generation Unit Physical Unclonable Function Scan Timing

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Solution Overview

Problem

Existing key generation technologies in hardware security protection architectures face challenges in generating unique keys without affecting the timing of scan verification, particularly when using combinational logic circuits in circuit systems designed for testability.

Innovation Solution

The proposed solution involves a key generation unit with a physical unclonable function that utilizes existing combinational logic circuits in a circuit system to generate multiple key values without adding additional combinational logic circuits to the original path of scanning flip-flops, thereby avoiding timing errors during scan verification.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If combinational logic circuits are added between scanning flip-flops to generate unique keys, then key uniqueness and security are improved, but timing errors during scan verification occur

Engineering Contradiction:
Improvekey securityVSAvoidtiming accuracy
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent extracts the key generation function from the original combinational logic circuit path and relocates it to a separate key generation unit. The original combinational logic circuits are removed from between the scanning flip-flops, while a new key generation unit is introduced that uses the same combinational logic circuits but in a different configuration that does not interfere with scan verification timing.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent segments the circuit functionality by separating the scan verification path from the key generation path. The scanning flip-flops remain dedicated to scan verification, while a separate key generation unit utilizes the combinational logic circuits to generate keys. This segmentation allows both functions to operate independently without timing conflicts.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If combinational logic circuits are integrated into the scanning flip-flop path, then key generation capability is improved, but scan verification timing is disrupted

Engineering Contradiction:
Improvekey generation capabilityVSAvoidscan verification timing
Core Design Contradiction:
Adaptability or versatilityVSLoss of time

Solution Approach 1:

The patent introduces a key generation unit as an intermediary component that mediates between the combinational logic circuits and the scanning flip-flops. This intermediary unit captures the output of the combinational logic circuits at appropriate timing points and stores it in dedicated storage elements, preventing direct interference with the scan verification timing while still enabling key generation.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent performs preliminary action by capturing the combinational logic circuit outputs at specific timing points before they can affect the scan verification process. The key generation unit samples and stores these outputs during initialization or setup phases, ensuring that the scan verification timing remains unaffected during normal operation.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS12341914B2Key generation unit with physical unclonable function, key generator and circuit system
Publication Date: 2025.06.24 NUVOTON
  • US12341914B2 patent drawing
  • US12341914B2 patent drawing
  • US12341914B2 patent drawing

AI summary

A key generation technology of the present disclosure does not additionally set a combinational logic circuit on an original path of a scanning flip-flop, but utilizes a plurality of existing combinational logic circuits in a circuit system to generate multiple values of a key. Correspondingly, a key generation unit used in the key generation technology has two data flip-flops. One of the data flip-flops is used as a data flip-flop in one of a plurality of scanning flip-flops. The other data flip-flop is to obtain a node data signal of a node in the corresponding combinational logic circuit as one of the values of the key.