Laser Array Emitter Isolation for Defect-Tolerant Power Output
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Solution Overview
Problem
The challenge of accurately growing multiple lasers on a semiconductor wafer results in low yield of usable laser arrays due to weak or dead lasers, which can generate heat and short out the array.
Innovation Solution
Individual testing of lasers to identify good and bad lasers, followed by electrical isolation of bad lasers using non-conducting layers or removal processes, ensuring only good lasers are powered by the supply source.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple lasers are grown on a semiconductor wafer, then the quantity of laser arrays is increased, but the manufacturing precision deteriorates resulting in low yield of usable laser arrays
Solution Approach 1:
The patent divides the laser array into individually addressable segments by implementing separate electrical connections to each laser emitter through a connector assembly. This allows individual testing and isolation of each laser, enabling the system to function even when some emitters are defective, thereby resolving the contradiction between mass production and manufacturing precision.
2Reliability
If all lasers in the array are electrically connected, then the power output is maximized, but the reliability deteriorates due to heat and shorting from bad lasers
Solution Approach 1:
The patent implements a dynamic electrical connection system where the connectivity of each laser emitter can be individually controlled through the connector assembly. Good lasers are electrically connected to contribute to power output, while bad lasers are isolated to prevent reliability issues. This dynamic configuration resolves the contradiction between maximizing power and ensuring reliability.
3Manufacturing precision
If individual testing of lasers is performed, then the manufacturing precision is improved by identifying good and bad lasers, but the device complexity increases due to additional testing and isolation mechanisms
Solution Approach 1:
The patent introduces an intermediary connector assembly that provides individual electrical access to each laser emitter. This intermediary structure enables simple individual testing and isolation operations without requiring complex integrated testing systems, thus resolving the contradiction between manufacturing precision and device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Increases the yield of usable laser arrays by preventing bad lasers from heating or shorting out the array, enhancing reliability and power output.
Implementation Method 1
an electrical connector assembly that electrically connects a supply source to the identified good lasers while electrically isolating the identified bad lasers
Implementation Method 2
at least a portion of one of the bad lasers is removed after being identified as a bad laser
Data Source
AI summary
A laser assembly (10) includes a substrate (22); a plurality of spaced apart, lasers (20) grown on the substrate (22); and an electrical connector assembly (14). The lasers (20) are individually tested to identify if the tested lasers (20) are a good laser (20a) or a bad laser (20b). The electrical connector assembly (14) is adapted to electrically connect a supply source (16) of electrical power to the identified good lasers (20a), while not electrically connecting the identified bad lasers (20b) to the supply source (16). Thus, the identified bad lasers (20B) are electrically isolated from the supply source (16).