Laser Beam Imaging Control for Focus and Processing Speed

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Solution Overview

Problem

Conventional laser processing machines struggle to accurately determine and control the state of the beam generated in the processing region due to the interference of illumination beams and reflected radiation, leading to inaccurate monitoring of the processing region.

Innovation Solution

A laser processing machine equipped with an imaging device and a control device that analyzes image information to adjust the focus position and processing velocity of the laser beam to match preset reference values, ensuring accurate control and monitoring of the beam state.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If an illuminating device is provided in the laser processing head to illuminate the processing region, then the processing region can be monitored during laser processing, but the image acquired becomes a synthesis of electromagnetic radiation from the processing region and reflected illumination beam, making it impossible to accurately determine the beam state

Engineering Contradiction:
Improvebeam state determination accuracyVSAvoidpure electromagnetic radiation signal
Core Design Contradiction:
Measurement precisionVSLoss of information

Solution Approach 1:

The patent removes the illuminating device from the laser processing head, extracting the harmful illumination source that caused signal contamination. This allows the imaging device to capture only the electromagnetic radiation from the processing region without superimposed reflected illumination beams, thereby enabling accurate determination of beam state.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent introduces a beam state determination device as an intermediary component that specifically detects the electromagnetic radiation from the processing region. This mediator separates the measurement function from the processing function, allowing accurate beam state monitoring without the need for illuminating devices that would contaminate the signal.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Illumination intensity

If the illuminating device illuminates the processing region, then the processing region becomes visible for monitoring, but the reflected illumination beam interferes with the electromagnetic radiation signal from the processing region

Engineering Contradiction:
Improveprocessing region visibilityVSAvoidreflected illumination beam interference
Core Design Contradiction:
Illumination intensityVSObject-generated harmful factors

Solution Approach 1:

The patent converts the harmful reflected illumination beam into a beneficial setup by completely removing the illumination source. The imaging device then utilizes only the electromagnetic radiation naturally emitted from the processing region (including plasma radiation and laser-induced fluorescence), transforming the problem of signal contamination into a clean measurement scenario where only relevant signals are detected.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Productivity

If the imaging device acquires images during laser processing with illumination, then real-time monitoring is possible, but the synthesized image contains both processing region radiation and illumination reflection making beam state control inaccurate

Engineering Contradiction:
Improvereal-time monitoring capabilityVSAvoidbeam state control accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The patent segments the monitoring function from the processing function by providing a dedicated beam state determination device that operates independently of any illuminating device. This segmentation allows the imaging system to capture pure electromagnetic radiation signals for accurate beam state determination while maintaining real-time monitoring capabilities, without the confounding factor of reflected illumination.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables precise control of the laser processing by adjusting the focus position and processing velocity based on real-time image analysis, improving the accuracy and quality of the laser processing operation.

Implementation Method 1

respective electromagnetic radiations generated from the processing region within the first time intervals and the second time intervals are detected as an image of the electromagnetic radiation of a video stream

Methodology Applied
Scientific EffectElectromagnetic radiation detection: Photoelectric Effect

Implementation Method 2

a laser processing unit configured to process a workpiece by using a laser beam

Methodology Applied
Scientific EffectLaser irradiation: Laser

Implementation Method 3

an image of a beam obtained by synthesizing an electromagnetic radiation that travels backward to the processing head, and a beam that results from a separate illumination beam to the processing region by the illuminating device and reflects to the processing head

Methodology Applied
Scientific EffectLight absorption: Absorption (EM radiation)

Data Source

PatentUS20230095329A1Laser processing machine and processing method
Publication Date: 2023.03.30 AMADA CO LTD
  • US20230095329A1 patent drawing
  • US20230095329A1 patent drawing
  • US20230095329A1 patent drawing

AI summary

A laser processing machine 100 includes: a laser processing unit 1 configured to process a workpiece W by using a laser beam L; an imaging device configured to image the workpiece W irradiated with the laser beam L; and a control device configured to control the laser processing unit 1 in accordance with a processing condition 51c for processing the workpiece W. The control device controls operation of the laser processing unit 1 such that size OIS of an optical image OI and a peak value PV of light intensity LI of the optical image OI observed from image information obtained by imaging the workpiece W with the imaging device approach preset reference values 60.