Semiconductor Laser Diode Contact Structure for Heat Dissipation

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Solution Overview

Problem

Modern high-power semiconductor lasers with ridge waveguide structures experience non-homogeneous light intensity distribution due to multiple oscillating modes, leading to reliability issues like catastrophic optical damage and reduced efficiency, primarily because of localized high intensity areas and poor heat dissipation.

Innovation Solution

A semiconductor laser diode design featuring a contact structure directly applied to the semiconductor layer sequence without intermediate materials, allowing for differential current injection through varying electrical contact resistances and conductivities, which controls mode behavior and enhances heat dissipation by selecting suitable contact materials and geometric arrangements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If a ridge waveguide structure is used in high-power semiconductor lasers, then the laser can generate high power output, but the light intensity becomes non-homogeneously distributed causing catastrophic optical damage and reduced reliability

Engineering Contradiction:
Improvepower outputVSAvoidreliability
Core Design Contradiction:
PowerVSReliability

Solution Approach 1:

The patent applies local quality by creating laterally differentiated contact structures with different electrical conductivities in different regions of the semiconductor laser. High-conductivity contact regions are positioned in areas requiring higher current injection to suppress high-intensity modes, while low-conductivity regions are placed where lower current is needed. This lateral variation in contact properties homogenizes the light intensity distribution on the facets, preventing catastrophic optical damage while maintaining high power output capability.

Inventive Principle:
Principle #3Local quality

2Power

If multiple oscillating modes are guided in the ridge waveguide, then high power output is achieved, but local hole burning occurs reducing laser efficiency

Engineering Contradiction:
Improvepower outputVSAvoidenergy efficiency
Core Design Contradiction:
PowerVSLoss of energy

Solution Approach 1:

The patent implements local quality through laterally differentiated contact structures that provide position-dependent current injection. By strategically placing high-conductivity contact regions, the laser achieves more uniform carrier distribution across the active region, reducing localized energy depletion (hole burning) while maintaining the multiple-mode operation necessary for high power output. This results in improved energy efficiency without sacrificing power capability.

Inventive Principle:
Principle #3Local quality

3Ease of manufacture

If conventional contact structures with intermediate materials are used, then manufacturing is simplified, but heat dissipation is poor leading to reduced reliability

Engineering Contradiction:
Improveease of manufactureVSAvoidheat dissipation
Core Design Contradiction:
Ease of manufactureVSTemperature

Solution Approach 1:

The patent extracts the intermediate material layer from the contact structure, creating a direct contact between the metal contact and the semiconductor surface. This elimination of the intermediate layer significantly improves thermal conductivity and heat dissipation from the active region. The direct contact structure maintains manufacturability through standard semiconductor fabrication processes while achieving superior thermal management, thereby improving reliability.

Inventive Principle:
Principle #2Taking out (Extraction)

4Ease of manufacture

If homogeneous contact structure is used across the semiconductor surface, then manufacturing is easier, but light intensity distribution remains non-homogeneous causing optical damage

Engineering Contradiction:
Improveease of manufactureVSAvoidoptical damage
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The patent implements local quality by creating laterally differentiated contact structures with varying electrical conductivities across the semiconductor surface. High-conductivity contact regions are positioned to suppress high-intensity optical modes that would cause catastrophic damage, while low-conductivity regions are placed where lower current injection is appropriate. This spatially varying contact structure homogenizes the light intensity distribution on the facets, preventing optical damage while maintaining ease of manufacture through conventional fabrication techniques.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design homogenizes light intensity distribution, increases efficiency, and improves reliability by allowing specific control over mode behavior and heat dissipation, reducing the risk of catastrophic optical damage and extending the service life of the semiconductor laser diode.

Implementation Method 1

enhances heat dissipation by selecting suitable contact materials and geometric arrangements

Methodology Applied
Scientific EffectThermal conduction: Conduction (thermal)

Implementation Method 2

allowing for differential current injection through varying electrical contact resistances and conductivities

Methodology Applied
Scientific EffectElectrical resistance: Electrical Resistance

Data Source

PatentUS11626707B2Semiconductor laser diode
Publication Date: 2023.04.11 AMS OSRAM INT GMBH
  • US11626707B2 patent drawing
  • US11626707B2 patent drawing
  • US11626707B2 patent drawing

AI summary

In an embodiment a semiconductor laser diode includes a semiconductor layer sequence comprising an active layer having a main extension plane, the semiconductor layer sequence configured to generate light in an active region and radiate the light via a light-outcoupling surface, wherein the active region extends from a rear surface opposite the light-outcoupling surface to the light-outcoupling surface along a longitudinal direction in the main extension plane and a continuous contact structure directly disposed on a surface of the semiconductor layer sequence, wherein the contact structure comprises in at least a first contact region a first electrical contact material in direct contact with the surface region and in at least a second contact region a second electrical contact material in direct contact with the surface region, wherein the first and second contact regions adjoin one another.