Dual Laser Diode Testing Fixture for Simultaneous Power and Wavelength Measurement
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Solution Overview
Problem
Current methods for testing laser diodes require separate procedures for optical power and wavelength measurements, which are time-consuming and inefficient, especially when performed on multiple diodes.
Innovation Solution
A dual testing system and method that uses a testing fixture with an angled photodetector and optical coupling system to simultaneously detect and reflect laser light for both optical power and wavelength measurements, incorporating an optical power testing module and a wavelength measurement module such as an optical spectrum analyzer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If separate testing procedures are performed for optical power and wavelength measurements, then measurement reliability is improved, but testing time increases
Solution Approach 1:
The patent combines separate optical power measurement and wavelength measurement procedures into a single integrated testing system. The system uses a photodetector to detect laser light and simultaneously routes the detected light to both an optical power meter and a wavelength meter through optical coupling, enabling both measurements to be performed concurrently on each laser diode without requiring sequential separate testing procedures.
2Reliability
If multiple separate testing procedures are performed on each laser diode, then comprehensive quality assurance is improved, but manufacturing productivity decreases
Solution Approach 1:
The patent merges multiple separate testing procedures into a single integrated test station that performs both optical power and wavelength measurements simultaneously. This allows comprehensive quality assurance to be maintained while doubling the measurement throughput for each laser diode tested, directly improving manufacturing productivity.
Solution Approach 2:
The testing system is designed with multi-functionality to perform both optical power measurement and wavelength measurement using a single photodetector and optical coupling system. This universal testing apparatus can handle different measurement types without requiring separate dedicated equipment for each measurement, thereby improving overall manufacturing efficiency.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient and simultaneous performance of optical power and wavelength measurements, significantly reducing the time required to test multiple laser diodes and improving manufacturing efficiency.
Implementation Method 1
A photodetector may be positioned to receive the laser light on a light receiving surface for simultaneously detecting and reflecting the laser light
Implementation Method 2
The photodetector is configured both to detect the light being tested and to reflect the light being tested along an optical path
Data Source
AI summary
A dual testing system and method is used to perform both optical power and wavelength measurements on laser light emitted from a laser diode, such as a chip-on-submount (COS) laser diode or a laser diode in a bar laser. A testing fixture may be used to facilitate both measurements by simultaneously detecting the light for performing a first test including the optical power measurement(s) and reflecting the light for performing a second test including the wavelength measurement(s). The testing fixture may include an angled photodetector and an optical coupling system such as a collimating lens, a focal lens and an optical waveguide. The testing fixture may be electrically connected to an optical power testing module, such as a light-current-voltage (LIV) testing module, for performing the optical power measurement(s) and may be optically coupled to a wavelength measurement module, such as an optical spectrum analyzer (OSA) for performing the wavelength measurement(s).