Laser Diode Test Flow With Magnetic Transfer and Multi-Temperature Stations
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Solution Overview
Problem
Current laser diode testing systems require multiple independent test stations for various temperature and function tests, leading to increased costs, space requirements, and complexity due to the need for multiple test stations, cold and heat sources, and equipment transfer risks.
Innovation Solution
A modular laser diode testing system utilizing a magnetic levitation transfer device and controller to integrate multiple test stations on a single flow line, allowing flexible adjustment of station number, order, and distance, with a pick-and-place device for efficient transfer and precise temperature control.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple independent test stations are used for various temperature and function tests, then testing coverage is improved, but equipment cost and space requirements increase
Solution Approach 1:
The test station is designed to perform multiple testing functions (different temperature tests and various function tests) using a single integrated setup. The probe module can sequentially contact different laser diodes to perform electrical characteristic tests, optical characteristic tests, and tests at different temperatures without requiring separate dedicated stations for each function.
Solution Approach 2:
Multiple test functions and temperature control capabilities are merged into a single test station. The system combines low-temperature testing, room-temperature testing, high-temperature testing, and various electrical/optical characteristic tests in one integrated platform, eliminating the need for multiple independent stations.
2Adaptability or versatility
If multiple independent test stations are used for various temperature and function tests, then testing coverage is improved, but factory space requirements increase
Solution Approach 1:
The test station is designed to perform multiple testing functions (different temperature tests and various function tests) using a single integrated setup. The probe module can sequentially contact different laser diodes to perform electrical characteristic tests, optical characteristic tests, and tests at different temperatures without requiring separate dedicated stations for each function.
Solution Approach 2:
Multiple test functions and temperature control capabilities are merged into a single test station. The system combines low-temperature testing, room-temperature testing, high-temperature testing, and various electrical/optical characteristic tests in one integrated platform, eliminating the need for multiple independent stations.
3Adaptability or versatility
If device under test is transferred between different test stations, then multi-function testing is enabled, but transfer risks and operation complexity increase
Solution Approach 1:
Multiple test functions and temperature control capabilities are merged into a single test station. The system combines low-temperature testing, room-temperature testing, high-temperature testing, and various electrical/optical characteristic tests in one integrated platform, eliminating the need for multiple independent stations.
Solution Approach 2:
The test station incorporates dynamic temperature control capabilities, allowing the environment to be adjusted between low temperature, room temperature, and high temperature as needed for different test requirements. This dynamic adaptability enables multi-temperature testing without requiring physical transfer to different stationary test stations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enhances test efficiency, reduces equipment costs and space, and improves precision by enabling multi-temperature and multi-function testing in a single flow line, while minimizing interference and construction costs.
Implementation Method 1
A magnetic field is generated by at least one of the plurality of magnetic field excitation units of the electromagnetic slide under control of the main controller and interacts with a magnetic field generated by the at least one permanent magnet of the first transfer device, so that the first transfer device is driven to transfer the plurality of laser diodes
Data Source
AI summary
The present invention relates to a laser diode testing system and a laser diode testing method. The method comprises the steps of moving a laser bar or a plurality of laser diodes to a first test station by means of a first transfer device; then, electrically contacting each laser diode by a first probe module in sequence; measuring electrical and optical characteristics of the laser diodes electrically contacted by the first probe module sequentially by means of a first measuring device; moving the laser bar or the plurality of laser diodes out of the first test station by means of the first transfer device, wherein a magnetic field generated by an electromagnetic generating unit of an electromagnetic slide interacts with a magnetic field of a permanent magnet of the first transfer device, so that the first transfer device is driven and moved.