Laser Beam Focus Calibration Using Frequency Scan Analysis

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Solution Overview

Problem

Current methods for determining irradiation parameters in additive manufacturing are cumbersome and time-consuming, requiring complex optical systems and multiple measurement positions to calibrate energy beams effectively.

Innovation Solution

A method involving generating an energy beam and guiding it across a structured test surface to detect emitted radiation, with parameters determined through Fourier transformation of the signal, allowing for efficient calibration of irradiation devices without the need for extensive optical setups.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If complex optical systems and multiple measurement positions are used to determine irradiation parameters, then measurement precision is improved, but device complexity and time consumption increase

Engineering Contradiction:
Improveirradiation parameter determination accuracyVSAvoidoptical system complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts the essential measurement information by analyzing only the frequency spectrum of the signal at a single measurement position. Instead of using complex optical systems at multiple positions, the invention extracts the beam caustic parameters from the spectral content of the signal obtained at one location, thereby simplifying the measurement setup while maintaining determination accuracy

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent applies partial action by determining irradiation parameters through frequency analysis of a signal obtained at a single measurement position rather than performing complete spatial mapping. The Fourier transformation of the signal provides sufficient information to characterize the beam caustic without requiring exhaustive measurements across multiple positions, thus reducing device complexity and measurement time

Inventive Principle:
Principle #16Partial or excessive action

2Measurement precision

If complex optical systems are used to calibrate energy beams, then measurement precision is improved, but the time required for calibration increases

Engineering Contradiction:
Improvebeam calibration accuracyVSAvoidcalibration time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces mechanical measurement approaches (physical displacement to multiple positions, complex optical alignment) with signal processing methods. By using Fourier transformation to extract beam caustic parameters from the frequency spectrum of a signal obtained during normal operation, the invention eliminates time-consuming mechanical calibration procedures while maintaining measurement precision

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The measurement system utilizes the signal already generated during energy beam operation on the workpiece. Instead of requiring separate calibration procedures with additional equipment, the system self-calibrates by analyzing the frequency characteristics of the signal produced during normal manufacturing operations, thereby eliminating dedicated calibration time

Inventive Principle:
Principle #25Self-service

3Measurement precision

If multiple measurement positions are used to determine irradiation parameters, then measurement precision is improved, but productivity decreases

Engineering Contradiction:
Improveparameter determination accuracyVSAvoidcalibration efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent extracts all necessary beam characterization information from the frequency spectrum of a signal obtained at a single measurement position. The Fourier transformation reveals beam caustic parameters embedded in the spectral content, eliminating the need for time-consuming measurements at multiple positions and thereby improving calibration efficiency without sacrificing accuracy

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent performs preliminary frequency analysis on the signal during normal operation to pre-determine beam caustic parameters. This preliminary characterization of the energy beam allows for rapid identification of irradiation parameters without requiring subsequent time-consuming measurements, thus improving overall productivity

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach simplifies the determination of irradiation parameters, enabling faster and more efficient calibration of energy beams for additive manufacturing processes, reducing the complexity and time required for beam calibration across the build plane.

Implementation Method 1

generating a signal by detecting radiation that is emitted, in particular reflected, from the test surface

Methodology Applied
Scientific EffectRadiation emission: Thermal Radiation

Implementation Method 2

generating a signal by detecting radiation that is emitted, in particular reflected, from the test surface

Methodology Applied
Scientific EffectRadiation detection: Photoelectric Effect

Data Source

PatentUS11878365B2Focus adjustment and laser beam caustic estimation via frequency analysis of time traces and 2D raster scan data
Publication Date: 2024.01.23 CONCEPT LASER
  • US11878365B2 patent drawing
  • US11878365B2 patent drawing
  • US11878365B2 patent drawing

AI summary

Methods of determining at least one parameter of an irradiation device of an apparatus for additively manufacturing three-dimensional objects may include generating an energy beam and guiding the energy beam across a structured test surface, generating a signal by detecting radiation that is emitted from the test surface, and determining the at least one parameter based on a frequency spectrum of the signal.