Dual-Axis Laser Inclinometer Wavefront Homodyne Interference

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current inclinometer technologies, such as level, inductive, capacitive, and photoelectric types, face limitations in precision, traceability, and accuracy, particularly in high-end equipment applications, where high-precision dual-axis measurement with direct traceability to measurement results is lacking.

Innovation Solution

A high-precision dual-axis laser inclinometer based on wavefront homodyne interference, utilizing a laser light source module, integrated sensing module, and signal processing module, which generates and decouples wavefront interference signals to achieve high-precision horizontal inclination angle measurements, with the ability to directly trace results to laser wavelengths.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If traditional level type inclinometer is used, then device complexity is low, but measurement precision is low (0.02-0.05mm/m)

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the mechanical bubble position detection system with an optical interference-based measurement system. The wavefront homodyne interference method uses laser light and optical detectors to measure inclination angles, achieving higher precision (0.001mm/m or better) while eliminating the need for complex mechanical reading mechanisms and human eye observation.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the measurement parameter from bubble position (visual) to wavefront interference pattern (optical). By converting the inclination angle into a phase difference in the interference pattern, the system achieves continuous, high-precision measurement without the limitations of discrete bubble positions or visual reading.

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If inductive type inclinometer is used, then measurement precision improves (0.1 arcsecond resolution), but device complexity increases due to electromagnetic shielding and closed-loop control

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent replaces the electromagnetic inductive sensing system with an optical interference system. Instead of using coils and magnetic fields to detect inclination, the system uses laser light wavefronts and optical detectors, eliminating the need for electromagnetic shielding, magnetic bearings, and complex closed-loop control mechanisms.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an optical intermediary (laser light wavefront) that directly connects the inclination angle to the measurement signal. The wavefront acts as a mediator that converts mechanical inclination into optical phase changes, which are then detected by the camera, avoiding the need for complex electromagnetic intermediaries.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Measurement precision

If capacitive type inclinometer is used, then measurement precision improves (1 micrometer/meter resolution), but linearity is poor and processing error causes large measurement error

Engineering Contradiction:
Improvemeasurement precisionVSAvoidlinearity
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent replaces the capacitive sensing system with an optical interference system. Instead of measuring capacitance changes that are sensitive to processing errors and non-linearity, the system measures wavefront phase differences through optical interference, which provides inherently linear response and eliminates the need for complex calibration and error correction.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

4Measurement precision

If photoelectric type inclinometer based on laser self-collimation is used, then measurement precision improves (0.05 arcsecond resolution), but processing and installation errors of optical elements directly introduce measurement errors

Engineering Contradiction:
Improvemeasurement precisionVSAvoidoptical element processing accuracy
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent introduces the wavefront homodyne interference pattern as an intermediary that robustly connects the inclination angle to the measurement. Instead of directly measuring light spot position (which is sensitive to optical element alignment), the system measures the interference pattern's phase, which is invariant to optical element processing errors and provides direct traceability to the laser wavelength.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution provides high-resolution dual-axis measurement with improved energy efficiency, reduced nonlinear errors, and simplified structure, enabling precise and traceable measurements suitable for high-end equipment, while being cost-effective and easy to integrate.

Implementation Method 1

a laser light source module, configured to generate a laser signal

Methodology Applied
Scientific EffectLaser: Laser

Implementation Method 2

an integrated sensing module, connected to the laser light source module, and configured to receive the laser signal and generate a wavefront interference signal based on the laser signal

Methodology Applied
Scientific EffectWavefront homodyne interference: Interference

Data Source

PatentUS20230384090A1High-precision dual-axis laser inclinometer based on wavefront homodyne interference and measuring method
Publication Date: 2023.11.30 HARBIN INST OF TECH
  • US20230384090A1 patent drawing

AI summary

A high-precision dual-axis laser inclinometer based on wavefront homodyne interference and a measuring method are disclosed. The method includes: obtaining a laser signal through a laser light source module, transmitting the laser signal to an integrated sensing module, and generating a wavefront interference signal based on the integrated sensing module; and inputting the wavefront interference signal into a signal processing module for performing high-precision decoupling operation to obtain a horizontal inclination angle measurement result. The measurement resolution is high, the measurement result can be directly traced to the laser wavelength, high-precision dual-axis inclination angle measurement can be realized only by using single-beam measurement light, meanwhile, the laser inclinometer has the advantages of being simple in structure, simple in light path, easy to integrate, beneficial to engineering implementation, and high in cost performance, and the requirement of high-end equipment on the ultra-precision inclinometer is met.