Laser Mapping for Electronic Component Radiation Sensitivity
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Solution Overview
Problem
Current methods for evaluating the sensitivity of electronic components to heavy ions, neutrons, and protons are inadequate as they fail to accurately map charge collection zones in three dimensions and are costly due to the limited availability of particle beam facilities, leading to errors in penetration depth and location identification.
Innovation Solution
A method combining laser mapping to create sensitivity maps with four or five dimensions and using prediction codes to simulate the response of electronic components to ionizing particles, incorporating laser-generated charge excitation data and nuclear reaction databases to quantify sensitivity and predict potential malfunctions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If particle beam facilities are used to evaluate component sensitivity, then measurement accuracy is improved, but cost and accessibility deteriorate due to limited availability of such facilities
Solution Approach 1:
The patent uses laser beams to create copies of the ionization effects produced by particle beams. Instead of directly using expensive particle accelerators, the invention simulates particle radiation effects using laser-induced charge generation, providing a cost-effective alternative that replicates the essential measurement capabilities
Solution Approach 2:
The patent replaces the mechanical particle beam system with an optical laser system. The laser beam substitutes for the particle beam, using optical energy to generate charge carriers in the semiconductor material, thereby eliminating the need for complex and expensive particle acceleration infrastructure
2Measurement precision
If conventional particle irradiation methods are used, then charge collection zones can be identified, but three-dimensional location information is lost due to entire component irradiation
Solution Approach 1:
The patent applies local quality by using a focused laser beam that can be precisely positioned at specific locations within the component. This allows selective excitation of charge carriers in targeted regions, enabling the mapping of three-dimensional charge collection zones with high spatial resolution, unlike conventional methods that irradiate the entire component
Solution Approach 2:
The patent adds the third dimension (depth) to the sensitivity mapping by varying the focal point of the laser beam in depth. This enables three-dimensional cartography of charge collection zones, transforming the conventional two-dimensional surface mapping into a comprehensive 3D characterization
3Reliability
If particle accelerators are used for sensitivity evaluation, then particle interaction effects are accurately reproduced, but penetration depth accuracy deteriorates due to energy differences from radiative environment
Solution Approach 1:
The patent changes the energy parameter of the excitation source to match the radiative environment more closely. By using laser photons with energies corresponding to the bandgap of the semiconductor material, the method reproduces the penetration depth and interaction effects of actual radiation in space or terrestrial environments, avoiding the penetration depth issues of conventional particle accelerators
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach provides a precise, cost-effective means to determine the sensitivity of electronic components to ionizing radiation, enabling the identification of weaknesses and optimizing component design for improved radiation resistance.
Implementation Method 1
the electronic component thus put into service is excited by excitations produced by laser radiation
Implementation Method 2
a laser beam is shone on the electronic component thus put into service in order to excite it by excitations produced by laser radiation
Data Source
Figure 1a~1c
Figure 2~4b
AI summary
To analyse an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radiative environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.