Laser Mass Spectrometry Analysis Device Overlap Correction
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
In mass spectrometry, the accuracy of analysis is compromised due to overlap between irradiation ranges when multiple positions on a sample are irradiated with a laser beam, leading to variations in the amount of sample components ionized.
Innovation Solution
An analyzing device that acquires measurement data by irradiating multiple positions on a sample with a laser beam and performs analysis by excluding data from overlapping irradiation ranges, determining the excluded positions based on the area of the irradiation portion, calculated using the irradiation diameter and distance between positions, to create an intensity image without pixels corresponding to excluded areas.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple irradiation positions are sequentially irradiated with a laser beam to perform mass spectrometry imaging, then positional information on molecules can be acquired, but overlap of irradiation ranges causes variations in ionized sample component amounts and reduces analysis accuracy
Solution Approach 1:
The patent applies preliminary action by calculating and determining the excluded irradiation position based on the irradiation range and sample size before performing the mass spectrometry imaging. This allows the system to pre-identify positions that would cause overlap and exclude them from analysis, thereby preventing accuracy degradation before it occurs.
2Measurement precision
If the cross-section of the laser beam is shaped to tessellate a plane, then overlap of irradiation ranges is reduced, but the device configuration becomes more complex
Solution Approach 1:
The patent uses copying by creating a virtual model or calculation of the irradiation range and sample geometry to determine excluded positions. Instead of physically shaping the laser beam cross-section, the system calculates which positions would overlap and excludes those from analysis, achieving the same effect through computational copying rather than physical modification.
3Productivity
If data from excluded irradiation positions is included in the analysis, then more data points are available, but variations in ionized amounts from overlapping regions reduce measurement reliability
Solution Approach 1:
The patent applies taking out by extracting and excluding data from irradiation positions that would cause overlap from the analysis set. By identifying and removing these problematic data points before analysis, the system maintains measurement consistency and reliability while still utilizing the majority of available data from non-overlapping regions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach reduces the decrease in analysis accuracy caused by irradiation range overlap, allowing for more precise analysis without the need to shape the laser beam's cross-sectional shape, thereby simplifying the device configuration and maintaining data integrity.
Implementation Method 1
a plurality of positions (irradiation positions) in the sample are sequentially irradiated with a laser beam and ionized
Implementation Method 2
ionized, so that sample components at each position are sequentially ionized
Data Source
AI summary
An analyzing device includes: a measurement data acquisition unit that acquires measurement data obtained by irradiating a plurality of irradiation positions on a sample with a laser beam and performing mass spectrometry on a sample component corresponding to each irradiation position; and an analysis unit that performs analysis of the measurement data by excluding a set of data corresponding to an excluded irradiation position among the plurality of irradiation positions each having a different irradiation portion from which a portion that has been already irradiated with the laser beam is excluded in an irradiation range irradiated when the laser beam is irradiated to each irradiation position.