Laser Microdissection System with Long Working Distance Objective
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Solution Overview
Problem
Existing laser microdissection systems cannot effectively observe the bottom of deep wells, such as those in microwell plates, due to the limited working distance of objectives, which causes collisions with the sample and stage, preventing accurate inspection of dissectates captured in these wells.
Innovation Solution
The system incorporates a long working distance objective with an extended parfocal distance, allowing other objectives to pivot without colliding with the sample or stage, and a telescopic spacer ring to adjust the parfocal distance, enabling the inspection of deep wells by positioning the long working distance objective to focus on the well bottom without interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a standard objective is used to observe the sample, then the observation precision is sufficient, but the working distance is too short causing collision with the sample and stage when observing deep wells
Solution Approach 1:
The patent changes the working distance parameter of the objective by providing a selection between a first objective with a first working distance and a second objective with a second working distance greater than the first working distance. This allows the system to accommodate deep wells by selecting the second objective with extended working distance, preventing collision with the sample and stage while maintaining observation capability.
2Adaptability or versatility
If the objective is positioned to focus on the bottom of deep wells, then the well inspection capability is improved, but the other objectives collide with the sample and capture unit
Solution Approach 1:
The patent applies parameter changes by selecting objectives with different working distances based on the well depth. When inspecting deep wells, the system switches to a second objective with a longer working distance that extends beyond the well depth, ensuring the objective can focus on the well bottom without colliding with the sample or stage.
Solution Approach 2:
The patent implements dynamics through the objective selection mechanism that allows switching between different objectives with different working distances. The system dynamically adapts the optical configuration based on the specific inspection requirements, selecting the appropriate objective to match the well depth and avoid collisions.
3Length of moving object
If a long working distance objective is used, then the working distance is extended, but the parfocal distance may cause collision with sample and stage
Solution Approach 1:
The patent changes both working distance and parfocal distance parameters by providing a second objective with a second working distance greater than the first working distance and a second parfocal distance greater than the first parfocal distance. This coordinated parameter change ensures that when the second objective is used, its extended parfocal distance prevents collision with the sample and capture unit while maintaining focus on the well bottom.
Data Source
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Figure 3A~3B
AI summary
A laser microdissection system (100, 200) comprises a stage (110) configured to receive a sample (104) to be cut and a collection unit (108) comprising at least one well (106) arranged below the sample (104), the well (106) being arranged and configured to capture a dissectate (102) cut from the sample (104). The laser dissection system further comprises an objective nosepiece (112) mounting two or more objectives (114a, 114b, 204) that can be alternately pivoted into the optical axis (O) of the laser microdissection system (100, 200) for at least cutting and/or observing the sample (104). At least one of the objectives (114a, 114b, 204) is configured as a long working distance objective (114a, 204) having a working distance (WD) greater than or equal to the depth of the well (106) with a depth of at least 11.2 mm and at most 42 mm, and is configured such that the other objectives (114b) mounted by the objective nosepiece (112) do not collide with the sample (104), the collection unit (108) and/or the stage (110), when a bottom of the well (106) is in focus of the long working distance objective (114a, 204).