Scanning Laser Microscope Superresolution Alignment

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Solution Overview

Problem

Existing scanning laser microscopes face challenges in achieving precise superresolution imaging due to misalignment between the spot of return light and detector elements, which hinders correct image formation.

Innovation Solution

A scanning laser microscope configuration that includes a scanning portion, an objective lens, a detector portion with multiple detector elements, and a calculating portion to align the center position of the return light spot with the detector elements, allowing for automatic alignment and maintaining superresolution even if the positional relationship becomes misaligned.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a two-dimensional detector array is used for superresolution observation, then image resolution exceeds the diffraction limit, but precise alignment between the return light spot and detector elements becomes difficult to maintain

Engineering Contradiction:
Improveimage resolutionVSAvoidalignment precision
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The system performs preliminary alignment by calculating the center position of the return light spot using light intensity signals from detector elements before actual imaging. This preliminary positioning action ensures that the spot is correctly aligned with the detector array, preventing alignment errors from affecting the superresolution observation.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system uses light intensity signals from the detector elements to calculate the center position of the return light spot, creating a feedback mechanism. This feedback allows the system to detect and correct any misalignment between the spot and detector elements, maintaining precise alignment during operation.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If manual alignment methods are used to position the return light spot on detector elements, then alignment can be achieved, but the operation becomes complex and time-consuming

Engineering Contradiction:
Improvealignment precisionVSAvoidalignment operation
Core Design Contradiction:
Manufacturing precisionVSEase of operation

Solution Approach 1:

The system performs self-alignment by automatically calculating the center position of the return light spot using light intensity signals from the detector elements. This eliminates the need for manual alignment operations, making the system easier to operate while maintaining high alignment precision.

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The system replaces manual mechanical alignment operations with an automated calculation-based method. By using light intensity signals to compute the spot center position, the system substitutes complex manual positioning with a simpler automated process that achieves the same alignment precision.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

3Measurement precision

If the positional relationship between the return light spot and detector elements shifts during observation, then image quality deteriorates, but frequent realignment increases observation time

Engineering Contradiction:
Improveimage qualityVSAvoidobservation time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The continuous calculation of the return light spot center position using detector element signals creates a real-time feedback system. This feedback enables the system to detect and correct positional shifts immediately, maintaining image quality without requiring frequent interruptive realignment operations that would extend observation time.

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The system maintains continuous alignment monitoring and adjustment throughout the observation process. By continuously calculating the spot center position and maintaining proper alignment, the system ensures uninterrupted high-quality imaging without the need for time-consuming periodic realignment.

Inventive Principle:
Principle #20Continuity of useful action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the creation of images with the expected superresolution effect in a straightforward and precise manner, ensuring superior image quality despite potential misalignments.

Implementation Method 1

an objective lens that radiates the laser beam scanned by the scanning portion onto the specimen and that collects return light coming from the specimen

Methodology Applied
Scientific EffectLight collection and focusing: Lens

Implementation Method 2

a detector portion that has a plurality of detector elements arrayed at a position that is optically conjugate with the focal position of the objective lens

Methodology Applied
Scientific EffectPhotoelectric detection: Photoelectric Effect

Data Source

PatentUS9696532B2Scanning laser microscope
Publication Date: 2017.07.04 EVIDENT CORP
  • US9696532B2 patent drawing
  • US9696532B2 patent drawing
  • US9696532B2 patent drawing

AI summary

An image having an expected superresolution effect is created in a straightforward manner and with superior precision. The invention provides a scanning laser microscope including a scanner that scans a laser beam emitted from an Ar laser device on a specimen; an objective lens that radiates the laser beam scanned by the scanner onto the specimen and that collects return light coming from the specimen; a detector array that has a plurality of minute detector elements arrayed at a position that is optically conjugate with the focal position of the objective lens; and a superresolution calculating portion that calculates a center position of a spot of the return light that is incident on the detector array on the basis of a light intensity signal output from each of the minute detector elements in the detector array.