Laser Head Optics Position Sensing Using Low-Coherence Interferometry

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing laser processing machines lack precise and real-time control over the position of optical elements and operating parameters such as assist gas pressure and temperature, leading to potential inaccuracies in laser cutting, drilling, welding, and additive manufacturing processes.

Innovation Solution

The implementation of a low coherence interferometry technique for real-time monitoring of optical element positions and operating parameters, allowing for precise determination of optical path lengths and refractive index variations, thereby ensuring accurate control of laser processing conditions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If traditional laser processing machines are used without advanced monitoring systems, then the device complexity is low, but the manufacturing precision and reliability of laser processing operations deteriorate

Engineering Contradiction:
Improveprecision of laser processing operationsVSAvoidcomplexity of monitoring and control system
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent replaces complex mechanical measurement systems with optical interferometry. The interferometric system uses light waves to measure the position of optical elements with high precision, substituting mechanical sensors and actuators with an optical-based measurement approach that achieves sub-micrometer resolution without complex mechanical structures

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an interferometric measurement system as an intermediary between the optical elements and the control system. This intermediary uses reference beams and measurement beams that interfere to produce fringe patterns, providing precise position information without requiring direct mechanical contact or complex sensing mechanisms

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If real-time monitoring of optical element positions is implemented using low coherence interferometry, then the manufacturing precision improves, but the device complexity increases

Engineering Contradiction:
Improveprecision of optical element position measurementVSAvoidcomplexity of interferometry system
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent extracts only the essential measurement function from complex sensor systems. By using low coherence interferometry, it isolates the position measurement task to specific optical paths with beam splitters and detectors, removing unnecessary complexity from the overall system while maintaining high measurement precision

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The patent changes the measurement parameter from mechanical displacement to optical path difference. By measuring the interference fringe patterns resulting from optical path length differences, the system achieves high precision measurement without requiring complex mechanical measurement mechanisms

Inventive Principle:
Principle #35Parameter changes

3Reliability

If precise control of optical element positions is achieved through interferometry, then the reliability of laser processing improves, but the ease of operation deteriorates

Engineering Contradiction:
Improvereliability of laser processing controlVSAvoidease of system calibration and operation
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The patent implements a feedback system where the interferometric measurement of optical element positions is continuously monitored and fed back to the control system. This feedback enables automatic correction of position deviations, maintaining reliable laser processing control while reducing the need for manual intervention and calibration

Inventive Principle:
Principle #23Feedback

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables precise and repeatable control of laser beam direction and power distribution, improving the accuracy and consistency of laser processing operations, including cutting, drilling, welding, and additive manufacturing.

Implementation Method 1

generating a measurement optical beam (M) from a low coherence optical radiation source, said measurement optical beam being reflected or scattered by at least one back-reflective surface of an optical element interposed along an optical transport path of a processing laser beam; generating a reference optical beam (R) from said low coherence optical radiation source; superimposing said measurement optical beam (M) and said reference optical beam (R) to form a pattern of interference fringes

Methodology Applied
Scientific EffectInterference: Interference

Data Source

PatentUS20250135576A1Method and system for determining the local position of at least one optical element in a machine for laser processing of a material, using low-coherence optical interferometry techniques
Publication Date: 2025.05.01 ADIGE SPA
  • US20250135576A1 patent drawing
  • US20250135576A1 patent drawing
  • US20250135576A1 patent drawing

AI summary

A method for determining local position of an optical element associated with an optical path for transporting a laser beam in a working head of a machine for laser processing a material, includes generating a measurement beam of low coherence optical radiation traveling a measurement optical path, leading the measurement beam towards the optical element and the reflected or diffused measurement beam towards an optical interferometric sensor arrangement, generating a reference beam of low coherence optical radiation traveling a reference optical path and leading the reference beam towards the interferometric optical sensor arrangement, superimposing the measurement and reference beams on a common region of incidence, detecting a position of a pattern of interference fringes between the measurement and reference beams, and determining a difference in optical length between the measurement and reference optical paths as a function of the position of the interference pattern along an illumination axis.