Laser Patterning Examining Apparatus for Display EL Layers
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Solution Overview
Problem
The challenge in the development of flexible, miniaturized display units for mobile electronic devices lies in accurately examining and forming organic electro-luminescent (EL) layers using laser transfer patterning, where the pattern of the laser beam is critical but difficult to assess effectively.
Innovation Solution
A laser patterning examining apparatus is designed with a rotating plate, a prism unit for refracting and analyzing laser beams, a beam profiler for pattern analysis, and adjustable components to precisely control the alignment and movement of the laser beam, ensuring accurate pattern examination and minimization of distortion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Volume of moving object
If laser transfer patterning is used to form organic EL layers, then miniaturization and flexibility of display units are achieved, but accurate examination and control of laser beam patterns become difficult
Solution Approach 1:
A beam profiler is introduced as an intermediary device to measure and analyze the laser beam pattern before transfer. The beam profiler captures the intensity distribution and spatial characteristics of the laser beam, providing quantitative data for pattern examination. This mediator enables accurate measurement of laser parameters without directly interfering with the miniaturized display fabrication process.
Solution Approach 2:
The invention creates an optical copy or representation of the laser beam pattern through the beam profiler. By capturing and analyzing the beam's intensity distribution, spatial profile, and temporal characteristics, the system can examine the laser pattern indirectly through measured data rather than direct observation, thereby maintaining measurement precision in miniaturized systems.
2Manufacturing precision
If laser beam pattern examination is performed with high precision, then organic EL layer formation accuracy is improved, but device complexity increases
Solution Approach 1:
The beam profiler is designed to perform multiple functions: measuring beam intensity distribution, spatial profile, and temporal characteristics. This multi-functional device provides comprehensive laser pattern examination through a single instrument, reducing the need for multiple separate measurement devices and thereby controlling overall system complexity while maintaining high manufacturing precision.
3Measurement precision
If adjustable components are added to control laser beam alignment, then pattern examination accuracy is improved, but ease of operation decreases
Solution Approach 1:
The invention incorporates adjustable components that enable dynamic control of laser beam alignment and positioning. These adjustable elements allow real-time modification of beam parameters during examination, providing adaptability to different measurement requirements while maintaining operational simplicity through designed adjustment mechanisms.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This apparatus enables precise examination and control of laser beam patterns, facilitating the formation of organic EL layers with reduced distortion, thus supporting the development of flexible and miniaturized display units for mobile devices.
Implementation Method 1
a prism unit on the housing and refracts a first portion of the laser bean received from the laser emission unit and transmits a second portion
Implementation Method 2
a beam profiler installed on the housing and analyzes the pattern of the first portion refracted by the prism unit
Implementation Method 3
a mirror unit which is installed under the prism unit and reflects the part of the laser transmitted by the prism unit
Implementation Method 4
a coolant circulation unit which is installed inside the beam duct and circulates a coolant to dissipate the laser beam
Data Source
AI summary
A laser patterning examining apparatus includes a fixing plate, a rotating plate configured to move vertically with respect to the fixing plate and to rotate, a housing connected to the rotating plate, a laser emission unit over the fixing plate and emits a laser beam, a prism unit on the housing and refracts a first portion of the laser beam received from the laser emission unit and transmits a second portion of the laser beam, and a beam profiler on the housing and analyzes the pattern of the first portion refracted by the prism unit.