Laser-Induced Plasma Spectroscopy System for Surface Contamination Analysis and Sampling
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Solution Overview
Problem
Existing methods cannot simultaneously analyze the surface contamination of a material and take a sample for further qualitative or quantitative analysis, particularly in the context of radiological contamination in nuclear facilities.
Innovation Solution
A system utilizing a single pulsed laser for both laser-induced plasma spectrometry (LIBS) analysis and particle sampling, allowing for the analysis of the surface composition and collection of ablated particles for complementary analysis or control, including radiological contamination quantification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If separate LIBS analysis and sampling methods are used, then analysis capability is achieved, but device complexity and time loss increase
Solution Approach 1:
The patent combines LIBS analysis and sampling functions into a single integrated system. The pulsed laser serves dual purposes: generating plasma for spectral analysis and ablating particles for sampling. The optical collection system simultaneously captures both emitted light and ablated particles, eliminating the need for separate analytical and sampling equipment, thus reducing device complexity while improving productivity
Solution Approach 2:
The system employs multi-functional components where the pulsed laser performs both analysis and sampling functions, and the optical collection system handles both light gathering and particle aspiration. This universal approach allows a single system to perform multiple operations that traditionally required separate devices, reducing overall system complexity and operational time
2Measurement precision
If multiple separate systems are used for analysis and sampling, then measurement precision is maintained, but loss of time increases
Solution Approach 1:
The system enables continuous operation by performing LIBS analysis and particle sampling simultaneously using the same pulsed laser and collection system. Instead of sequential operations that would require time for setup and execution of separate methods, the integrated system maintains continuous useful action throughout the measurement process, eliminating idle time while preserving measurement precision through dedicated detection channels
3Ease of operation
If sampling is performed without prior analysis, then sampling capability is achieved, but loss of substance increases
Solution Approach 1:
The system performs preliminary LIBS analysis before or during the sampling process to identify the presence and characteristics of contaminants. This preliminary action allows the system to target sampling efforts specifically at contaminated areas, ensuring that sampling resources are not wasted on clean surfaces and minimizing overall material loss while maintaining ease of operation through automated identification and targeting
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient analysis and sampling of surface contamination, reducing waste and laboratory resources by ensuring sampled materials contain desired elements, and allowing for simultaneous or sequential analysis and sampling, enhancing the accuracy and efficiency of contamination control.
Implementation Method 1
a single pulsed laser, to generate a pulsed laser beam, capable of interacting with the surface layer and producing a plasma on the surface of the material
Implementation Method 2
the latter is collected and transmitted to a spectrometer; the lines of the spectrum thus obtained are recovered and analyzed
Implementation Method 3
a device for sucking up and collecting particles representative of this surface layer, extracted from the latter under the effect of the focused pulsed laser beam
Data Source
AI summary
System for analysing, by laser induced plasma spectroscopy, the composition of the surface layer of a material and for taking samples with a view to performing complementary analyses or examining this superficial layer, and method related thereto. The system comprises a single pulse laser (6), for generating a pulse laser beam, able to interact with the superficial layer of the material and produce a plasma on the surface of the material (4); a device (10, 12) for focusing the laser beam onto the surface of the material; a device (18, 20) for collecting the light emitted by the plasma; and a device (22) for analysing the spectrum of the collected light and for determining the elementary composition (nature and relative concentration of the elements) of the superficial layer from this spectral analysis. According to the invention, it furthermore comprises a device (30, 32, 34) for sucking up and collecting particles representative of the superficial layer, extracted from the latter, under the effect of the laser beam, with a view to performing qualitative or quantitative complementary analyses or examininations on the basis of said particles.