Laser Surface Reflectance Calibration for Uniform Processing
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Solution Overview
Problem
Laser processing methods face challenges in achieving uniform processing due to varying reflectance of the laser light entrance surface, which can lead to inappropriate processing conditions.
Innovation Solution
A method and device that emit measurement laser light to both a reference object and the object to be processed, calculate the reflectance of the object's surface, and adjust the processing laser light conditions accordingly to ensure consistent processing regardless of the surface reflectance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If laser processing is performed without adjusting for surface reflectance variations, then processing speed is maintained, but manufacturing precision deteriorates due to non-uniform energy absorption
Solution Approach 1:
The patent applies preliminary action by measuring the reflectance of the workpiece surface before laser processing and pre-calculating the appropriate laser parameters. This allows the processing to proceed uniformly without real-time adjustments, maintaining both precision and efficiency. The reflectance measurement and parameter calculation are performed in advance to ensure consistent processing results.
2Manufacturing precision
If a fixed laser emission condition is used for all workpieces, then device complexity is reduced, but manufacturing precision deteriorates due to reflectance variations
Solution Approach 1:
The patent implements feedback by measuring the actual reflectance of each workpiece surface and using this information to adjust the laser emission parameters. The system continuously monitors surface properties and modifies processing conditions accordingly, ensuring consistent results across different workpieces while maintaining manageable device complexity through automated control.
Solution Approach 2:
The patent applies parameter changes by dynamically adjusting laser emission conditions such as power, pulse duration, and frequency based on the measured reflectance values. This allows the system to optimize energy absorption for each specific workpiece surface, achieving uniform processing results without requiring complex hardware modifications.
3Manufacturing precision
If an antireflection film is formed on the workpiece surface, then manufacturing precision is improved through uniform energy absorption, but device complexity and processing time increase
Solution Approach 1:
The patent replaces the mechanical/chemical approach of forming an antireflection film with an optical measurement and computational approach. Instead of physically modifying the surface to change its reflectance properties, the system measures the actual reflectance and adjusts laser parameters accordingly, achieving the same uniform energy absorption effect without additional processing steps or material deposition.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables appropriate laser processing by accurately adjusting the processing conditions based on the calculated reflectance, ensuring consistent results despite variations in the laser light entrance surface.
Implementation Method 1
a reflectance detection step of detecting a reflectance of a laser beam on an illuminated surface of a workpiece
Implementation Method 2
a laser processing step of, after the antireflection film formation step, emitting the laser beam to the illuminated surface of the workpiece to form a modified layer inside the workpiece
Data Source
AI summary
A laser processing method includes a first step of emitting measurement laser light of a first wavelength from the reference surface side to a reference object having a reference surface of which reflectance for the first wavelength is known to obtain a reference light amount as a reflected light amount of the measurement laser light on the reference surface, a second step of emitting the measurement laser light from the first surface side to the object to be processed to obtain a first light amount as a reflected light amount of the measurement laser light on the first surface, and a third step of, after the first step and the second step, calculating a reflectance of the first surface for the first wavelength based on a reflectance of the reference object, the reference light amount, and the first light amount.