Semiconductor Laser Reflector Layout for Uniform Beam Intensity
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing semiconductor laser devices face issues with dispersion in reflectance due to varying laser-light incident angles, leading to potential degradation in communication quality and reduced light output.
Innovation Solution
The semiconductor laser device employs two-stage reflective surfaces with specific inclination angles, where one reflective surface is formed by a dielectric multi-layer film on a photodiode, and the secondary reflective surface is set to angles less and more than 45 degrees relative to the beam center, respectively, to minimize dispersion in reflectance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single reflective surface is used to reflect laser light, then the structure is simple, but dispersion in reflectance occurs due to varying incident angles, degrading communication quality
Solution Approach 1:
The single reflective surface is divided into two separate reflective surfaces with different inclination angles. The first reflective surface reflects light within a certain angular range, while the second reflective surface reflects light in another angular range, collectively covering the full spread angle of the laser beam. This segmentation eliminates reflectance dispersion and maintains communication quality.
Solution Approach 2:
Different regions of the reflective system are assigned different inclination angles tailored to specific incident angle ranges. The first reflective surface has an inclination angle optimized for central beam components, while the second reflective surface has an inclination angle optimized for peripheral beam components. This local optimization ensures uniform reflectance across the entire beam profile.
2Ease of operation
If a 45-degree inclined reflective surface is used to bend light perpendicular to the stem top face, then the light path is controlled, but dispersion in incident angle causes deformation in intensity distribution
Solution Approach 1:
The single 45-degree reflective surface is segmented into two reflective surfaces with different inclination angles. Each surface is responsible for reflecting light within a specific angular subset, ensuring that all incident angles within the spread angle are reflected with uniform intensity. This maintains the bent light path while eliminating intensity distribution deformation.
3Volume of moving object
If the photodiode is positioned on the rear-end side of the laser chip, then the structure is compact, but the forward-to-rearward output ratio becomes unstable, reducing control accuracy
Solution Approach 1:
Instead of positioning the photodiode on the rear-end side to monitor backward output, the invention positions the photodiode to monitor forward output by reflecting forward-emitted light onto the photodiode surface. This inversion of the monitoring approach provides stable forward-to-rearward output ratio measurement, enabling accurate control while maintaining device compactness.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration reduces dispersion in reflectance, ensuring uniform intensity distribution of laser light and maintaining high communication quality while minimizing light output reduction.
Implementation Method 1
a reflective surface for reflecting laser light incident from the semiconductor laser light source toward the emission port; and a secondary reflective surface for reflecting laser light incident from the semiconductor laser light source toward the emission port
Implementation Method 2
one of said reflective surface and said secondary reflective surface is constituted by a dielectric multi-layer film that is formed on a photodiode
Data Source
AI summary
A semiconductor laser device disclosed in this application is characterized; wherein one of the reflective surface and the secondary reflective surface is constituted by a dielectric multi-layer film that is formed on a PD chip for measuring a light quantity of the laser light; and wherein an inclination angle of the reflective surface is set to a value obtained by subtraction of a value that is less than an inclination angle of beam center, from 45 degrees, while an inclination angle of the secondary reflective surface is set to a value obtained by subtraction of a value that is more than the inclination angle of beam center, from 45 degrees.


