3D Laser Scanner Inspection Using Strike Position Comparison
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
There is a lack of an effective inspection method for three-dimensional laser scanners, as existing methods are complex and do not accurately verify the position where laser light strikes the object or measure the distance correctly, which is crucial for ensuring measurement accuracy and device calibration.
Innovation Solution
An inspection method and device that utilize a casing with first and second sensors, separated by a reference interval, to measure spatial positions and strike positions, comparing measurement results to determine the accuracy of the laser scanner's measurements, and a correction method to adjust for any discrepancies.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a retroreflector is used for inspection, then measurement accuracy can be improved, but the inspection method becomes complex and cannot be applied to three-dimensional laser scanners
Solution Approach 1:
The patent uses a sensor that detects the position where laser light strikes it, creating a simplified model of the measurement process. Instead of using complex retroreflectors, the sensor directly records strike positions, which are then compared to spatial positions measured by the three-dimensional laser scanner. This copying approach simplifies the inspection device while maintaining measurement accuracy.
Solution Approach 2:
The patent extracts only the essential function needed for inspection - detecting light strike position - from the complex retroreflector system. By using a simple sensor to detect where laser light strikes the inspection device, the method removes unnecessary complexity while preserving the core measurement capability.
2Measurement precision
If multiple sensors are used to measure positions, then measurement accuracy is improved, but the device structure becomes more complex
Solution Approach 1:
The patent makes a single sensor perform multiple functions by moving it to different positions. The sensor first measures the strike position at the first position, then moves to measure the strike position at the second position. This multi-functionality approach allows one sensor to replace what would otherwise require multiple sensors, reducing device complexity while maintaining measurement precision.
Solution Approach 2:
The patent employs a dynamic sensor position system where the sensor can move between different locations on the inspection device. This dynamic arrangement allows the same sensor to occupy different spatial positions during the inspection process, enabling multiple measurements without requiring multiple fixed sensors, thus simplifying the overall device structure.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach simplifies the inspection of three-dimensional laser scanners by accurately measuring and comparing spatial and strike positions, enabling easy verification of measurement accuracy and facilitating calibration, thereby improving the reliability and efficiency of the inspection process.
Implementation Method 1
emitting the laser light toward the measured object and collecting light reflected by the measured object
Implementation Method 2
measuring a first strike position where the inspection device is struck by the laser light
Data Source
AI summary
An inspection method, correction method, and inspection device that include measuring a first spatial position where laser light is emitted at a first region and measuring a first strike position where the inspection device is struck by the laser light in the first region, the measurements being performed by emitting the laser light at the first region of the inspection device; measuring a second spatial position where the laser light is emitted at a second region and measuring a second strike position where the inspection device is struck by the laser light in the second region, the measurements being performed by emitting the laser light at the second region of the inspection device; and comparing measurement results for the first spatial position and the second spatial position with measurement results for the first strike position and the second strike position.


