2D Laser Scanner Stack Measurement for Wallboard Width
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Solution Overview
Problem
Current methods are inadequate for accurately measuring the width and edge profiles of individual wallboards within a stack of multiple post-kiln wallboards, which is crucial for quality control and compliance with specifications.
Innovation Solution
The use of 2D laser scanners to generate distance measurements of the cross-machine and machine-direction edges of a stack, with a processor analyzing these measurements to calculate the width and edge profile of a target wallboard, determining compliance with specified tolerances, and directing the stack for taping or recycling accordingly.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional measurement methods are used on stacked wallboards, then measurement complexity increases, but measurement precision deteriorates
Solution Approach 1:
The patent applies segmentation by dividing the measurement task into distinct phases: first scanning the entire stack to identify individual board boundaries and select a target board, then performing detailed width and edge profile measurements on the selected target board. This segmentation allows the system to achieve precise measurements of a single board without the complexity of simultaneously measuring all boards in the stack.
Solution Approach 2:
The patent extracts the measurement focus from the entire stack to a single target wallboard. By selecting one specific board from the stack as the measurement target and isolating it for detailed analysis, the system achieves high measurement precision while avoiding the complexity of analyzing all boards simultaneously. The target board is identified through preliminary scanning and then extracted as the sole subject of detailed measurement.
2Measurement precision
If individual wallboard inspection is performed in a stack, then measurement accuracy improves, but inspection time increases
Solution Approach 1:
The patent merges the identification and measurement functions into a single automated process. The laser scanner simultaneously performs preliminary scanning to identify board boundaries and select a target board, followed by detailed measurement of the target board's width and edge profile. This merging of functions eliminates manual inspection time while maintaining high measurement accuracy through automated target selection and measurement execution.
Solution Approach 2:
The measurement system performs self-service by automatically selecting a target wallboard from the stack based on preliminary scan data, then autonomously executing the detailed measurement process. The system identifies boards, selects a target, and performs measurements without human intervention, significantly reducing inspection time while maintaining precision through consistent automated procedures.
3Reliability
If comprehensive stack analysis is performed, then quality control improves, but processing energy increases
Solution Approach 1:
The patent applies partial action by performing comprehensive preliminary scanning of the entire stack to identify all board boundaries and characteristics, but then limiting detailed high-energy measurement to only the selected target board. This approach ensures quality control reliability through complete stack awareness while reducing processing energy by concentrating detailed analysis on a single board rather than all boards in the stack.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This method enables rapid and accurate analysis of multiple wallboards in a stack, improving efficiency and reducing the time and energy required for individual inspections, ensuring compliance with product specifications.
Implementation Method 1
scanning with a laser beam of a first 2D laser scanner at least a first portion of a cross-machine surface of a stack arranged from at least two wallboards
Data Source
AI summary
This disclosure provides systems and methods for continuous wallboard manufacturing, and in particular methods that include measuring a wallboard width and edge profiles in a post-kiln stack of at least two wallboards or more with a laser scanner, preferably a two-dimensional (2D) laser scanner positioned at a distance from a post-kiln conveyor and performing a laser scan of the stack passing by on the post-kiln conveyor.